1980
DOI: 10.1021/ac50061a042
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Atomic fluorine spectra in the argon inductively coupled plasma

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1981
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Cited by 71 publications
(26 citation statements)
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“…An additional obstacle is that the wavelengths of the resonant lines are under 100 nm requiring a sophisticated optical system. Only a few papers are published about fluorine determination in gaseous samples at the non-resonant line (F I 685.602 nm) by ICP-AES using direct injection via a gas sampling loop or a gas chromatographic apparatus [1][2][3]. The fluorine emission line of 685.602 nm can be detected not only with ICP-AES but also with gas chromatography microwave induced plasma atomic emission spectrometry (MIP-AES) [4,5].…”
Section: Introductionmentioning
confidence: 99%
“…An additional obstacle is that the wavelengths of the resonant lines are under 100 nm requiring a sophisticated optical system. Only a few papers are published about fluorine determination in gaseous samples at the non-resonant line (F I 685.602 nm) by ICP-AES using direct injection via a gas sampling loop or a gas chromatographic apparatus [1][2][3]. The fluorine emission line of 685.602 nm can be detected not only with ICP-AES but also with gas chromatography microwave induced plasma atomic emission spectrometry (MIP-AES) [4,5].…”
Section: Introductionmentioning
confidence: 99%
“…For example, the determination of non-metals, such as Br, C, Cl, F, and S, in gaseous samples has been performed by ICP-OES. [19][20][21] Real-time monitoring and determination of trace metals for continuous on-line process control have also been applied to the polymer industry for analysis of inorganic impurities in ethene gas by ICP-MS. 22 Electronic grade gases utilized for the semiconductor manufacturing process have been introduced to sealed ICP-OES 23,24 and ICP-MS 25 instruments for ultra-trace level impurity measurements.…”
Section: Introductionmentioning
confidence: 99%
“…The high excitation and ionisation potentials present for fluorine result in extremely poor sensitivity for the determination by ICP-AES and ICP-MS. Because of the poor sensitivity, few papers have been reported concerning fluorine detection by ICP. [1][2][3] Fry et al 2 introduced gaseous fluorocarbons via a gas sampling loop and measured the atomic emission intensities at 685.602 nm, a non-resonance atomic emission line. Moreover, by using a gas chromatographic apparatus instead of the gas sampling loop, selective detection of the analytes could be performed.…”
Section: Introductionmentioning
confidence: 99%