2002
DOI: 10.1002/sia.1167
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Atomic force microscopy of thin organic films on silicon in ultrahigh vacuum and under ambient conditions

Abstract: In this paper we investigate thin organic films on silicon oxide by different atomic force microscopy (AFM) techniques. For the preparation of the organic films we chose octadecyltrichlorosilane (OTS), which shows a strong tendency for self-assembly. As substrates we use silicon covered with a native silicon oxide. The self-assembled monolayers are deposited in solution to give octadecylsiloxane (ODS) islands. Island density and size vary, among other things, with the solution age, its concentration and the de… Show more

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Cited by 20 publications
(16 citation statements)
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“…AFM topographical images are known to be strongly dependent on circumstances such as an ultrahigh vacuum or liquid conditions. [20] In our results, the depth profile from AFM topography was similar to the result obtained from imaging elipsometry (NANOFILM, Accurion, Goettingen, Germany) (see the Supporting Information), indicating that the AFM topographical image showed nearly the full depth of the PIPAAm surface. The wettability of PIPAAm surfaces under an aqueous condition was evaluated with the captive bubble method at 37 and 20 8C ( Figure S2 in the Supporting Information).…”
Section: Resultssupporting
confidence: 84%
See 1 more Smart Citation
“…AFM topographical images are known to be strongly dependent on circumstances such as an ultrahigh vacuum or liquid conditions. [20] In our results, the depth profile from AFM topography was similar to the result obtained from imaging elipsometry (NANOFILM, Accurion, Goettingen, Germany) (see the Supporting Information), indicating that the AFM topographical image showed nearly the full depth of the PIPAAm surface. The wettability of PIPAAm surfaces under an aqueous condition was evaluated with the captive bubble method at 37 and 20 8C ( Figure S2 in the Supporting Information).…”
Section: Resultssupporting
confidence: 84%
“…First, force/distance curves were obtained after prolonged incubation at 37 8C. Then, the adhesion force was monitored at 3,5,10,15,20,30,60,120,180, and 240 min immediately after the temperature in the AFM fluid cuvette decreased to 20 8C. It was noteworthy that water in the liquid cuvette attained the pre-set temperature within 2 min (see Figure S4 in the Supporting Information).…”
Section: Resultsmentioning
confidence: 99%
“…[58] In contrast, shorter-chain molecules do not show island growth. [56] Several AFM studies revealed that the deposition process strongly depends on parameters such as solvent, [59] solution age, [60][61][62] water content, [51,60,61,63] deposition time, [62][63][64] and temperature. [65][66][67][68] Vallant et al observed both homogeneous growth and island-type growth depending on the water content and age of the silane solution.…”
Section: Mechanism Of Formationmentioning
confidence: 99%
“…[58] Kurzkettige Moleküle weisen dagegen kein Inselwachstum auf. [56] Verschiedene AFM-Studien machten deutlich, dass der Abscheidungsprozess stark von Parametern wie der Art des Lösungs-mittels, [59] dem Alter der Lösung, [60][61][62] dem Wassergehalt, [51,60,61,63] der Abscheidungszeit [62][63][64] und der Temperatur [65][66][67][68] [64] Der Mechanismus der Monoschichtenbildung ist komplex und hängt von vielen Parametern ab; dennoch wurden in einigen Studien Langmuir-Adsorptionskinetiken erster Ordnung beobachtet. Bei diesen Studien wurden Analysetechniken wie In-situ-ATR-IR, [69] AFM, [61] Röntgenreflexion [70] und Ellipsometrie eingesetzt.…”
Section: Bildungsmechanismusunclassified