2020
DOI: 10.1002/admi.202000844
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Atomic Layer Engineering of Epsilon‐Near‐Zero Ultrathin Films with Controllable Field Enhancement

Abstract: Enhanced and controlled light absorption, as well as field confinement in optically thin materials, are pivotal for energy‐efficient optoelectronics and nonlinear optical devices. Highly doped transparent conducting oxide (TCO) thin films can support the so‐called epsilon near zero (ENZ) modes in a frequency region of near‐zero permittivity, which can lead to the perfect light absorption and ultrastrong electric field intensity enhancement (FIE) within the films. To achieve full control over absorption and FIE… Show more

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Cited by 32 publications
(34 citation statements)
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“…[ 101 ] Up to date, several groups reported on the tuning of ENZ wavelength in the ranges 1320–2300, [ 94 ] 1450–1545, [ 101 ] 1500–1700, [ 95 ] 1550–1700, [ 96 ] 1600–2200, [ 99 ] and 1800–2400 nm. [ 97 ] As an example, Figure 8 shows ENZ wavelength dependences on substrate temperature, dopant concentration, and thickness for AZO layers grown by ALD on silica and silicon substrates by Gurung et al [ 96 ] The ENZ wavelength blueshifts as the substrate temperature increases from 225 to 250 °C (Figure 8a,d), which can be explained by the increase in doping efficiency (the ratio of electrically active Al species to total Al content in the matrix) as well as an increase in the grain size, and the improvement in crystal structure of AZO with increasing deposition temperature. The better crystallinity of the films should result in a reduction of scattering centers for electrons, and thus an increase in carrier mobility.…”
Section: Zno:al Thin Filmsmentioning
confidence: 99%
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“…[ 101 ] Up to date, several groups reported on the tuning of ENZ wavelength in the ranges 1320–2300, [ 94 ] 1450–1545, [ 101 ] 1500–1700, [ 95 ] 1550–1700, [ 96 ] 1600–2200, [ 99 ] and 1800–2400 nm. [ 97 ] As an example, Figure 8 shows ENZ wavelength dependences on substrate temperature, dopant concentration, and thickness for AZO layers grown by ALD on silica and silicon substrates by Gurung et al [ 96 ] The ENZ wavelength blueshifts as the substrate temperature increases from 225 to 250 °C (Figure 8a,d), which can be explained by the increase in doping efficiency (the ratio of electrically active Al species to total Al content in the matrix) as well as an increase in the grain size, and the improvement in crystal structure of AZO with increasing deposition temperature. The better crystallinity of the films should result in a reduction of scattering centers for electrons, and thus an increase in carrier mobility.…”
Section: Zno:al Thin Filmsmentioning
confidence: 99%
“…Figure 8b,e shows that as the Al content increases (dopant ratio ZnO:Al decreases), the ENZ wavelength (as well as loss) first decreases and then increases again. Gurung et al [ 96 ] explained this finding by doping saturation as well as the formation of Zn vacancies at high Al concentrations. As the Al content of AZO increases, the carrier concentration increases until it reaches a maximum value.…”
Section: Zno:al Thin Filmsmentioning
confidence: 99%
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“…The high field enhancement at PA may be effectively exploited for a variety of applications, e.g., designing high-efficiency photodetectors. [25,62]…”
Section: Tailoring Thermal Emissionmentioning
confidence: 99%