1999
DOI: 10.1103/physrevb.59.10895
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Atomic-scale scanning tunneling microscopy of amorphous surfaces

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Cited by 25 publications
(19 citation statements)
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“…Since then, many attempts have been made to atomically resolve amorphous materials, e.g. by SPM [43][44][45][46][47][48]. However, this goal has never been achieved so far.…”
Section: The Limits Of Scanning Probe Methodsmentioning
confidence: 98%
See 1 more Smart Citation
“…Since then, many attempts have been made to atomically resolve amorphous materials, e.g. by SPM [43][44][45][46][47][48]. However, this goal has never been achieved so far.…”
Section: The Limits Of Scanning Probe Methodsmentioning
confidence: 98%
“…Furthermore, it is often very demanding to separate electronic from topographic features in STM [44], as well as to distinguish the chemical sensitivity of changing tip apexes towards different surface sites, both in STM and AFM. In a stable imaging mode typically only one type of species is imaged on the sample surface, either the anionic or the cationic site, depending on the actual tip configuration.…”
Section: The Limits Of Scanning Probe Methodsmentioning
confidence: 99%
“…It is not surprising since MGs are topologically disordered, its surface is not expected to exhibit significant deviation in structure from the bulk. The few available properties from the past are mostly related to the study of surface morphologies: a roughening transition was found in some vapor-deposited MGs [12][13][14][15][16] and a recent AFM examination of bulk MGs showed surface striation [17]. Many basic questions, therefore, still remain unanswered.…”
mentioning
confidence: 97%
“…Zweitens gestaltet sich die Abbildung von stark dreidimensional korrugierten (aufgerauten) Oberflächen mit Rastersondenmikroskopen im Allgemeinen schwierig. Leicht tieferliegende Atompositionen in der obersten Lage sind dabei von benachbarten Atomen verdeckt 6. Kann man diese Probleme lösen?…”
Section: Ein Modell Und Wie Es Sich Untersuchen Lässtunclassified