1980
DOI: 10.1063/1.327958
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Auger spectra induced by 100-keV Ar+ impact on Be, Al, and Si

Abstract: The Auger electron spectrum induced by the impact of 100-keV Ar+ on metallic aluminum is shown to be consistent with the source of Auger electrons being ejected target particles. The principal spectral line has been identified as being due to ejected Al atoms with a single 2p vacancy. Subsidiary peaks are due to ejected atoms and Al+ ions with one or two 2p vacancies. The ion-induced Auger spectrum of silicon is similar. By contrast the spectrum induced by Ar+ impact on Be exhibits a rather broad peak characte… Show more

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Cited by 44 publications
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“…1974VRAKKING et ale 1979;WITT-MAACK. 1979;METZ et al .• 1980). The relative significance of the peak is related to the frequency of elastic scattering events.…”
Section: Spectramentioning
confidence: 99%
“…1974VRAKKING et ale 1979;WITT-MAACK. 1979;METZ et al .• 1980). The relative significance of the peak is related to the frequency of elastic scattering events.…”
Section: Spectramentioning
confidence: 99%