1998
DOI: 10.1007/s11664-998-0041-3
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Automated lifetime monitoring for factory process control

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Cited by 3 publications
(1 citation statement)
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“…A transient photoconductive (PC) decay technique has previously been used to measure the surface recombination velocity and lifetime of the excess photo-generated carriers in semiconductors [1][2][3][4][5][6]. Recently, it has been shown that the usefulness of this technique can be further enhanced to study interface traps by extending the range of measurements to relatively higher bias currents [7].…”
Section: Introductionmentioning
confidence: 99%
“…A transient photoconductive (PC) decay technique has previously been used to measure the surface recombination velocity and lifetime of the excess photo-generated carriers in semiconductors [1][2][3][4][5][6]. Recently, it has been shown that the usefulness of this technique can be further enhanced to study interface traps by extending the range of measurements to relatively higher bias currents [7].…”
Section: Introductionmentioning
confidence: 99%