Photomask Japan 2015: Photomask and Next-Generation Lithography Mask Technology XXII 2015
DOI: 10.1117/12.2198001
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Automatic classification and accurate size measurement of blank mask defects

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Cited by 3 publications
(3 citation statements)
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“…In automatic visual inspection systems, traditional approaches use the bounding box or the horizontal cross-section of the detected defect to estimate the defect size [61,62]. For surface defects, this does not represent the actual defect size and thus they recommend using the largest dimension of all cross-sections of the detected defect [62]. Those authors developed a software tool to detect and to calculate the defect characteristics, including the defect size, shape, location and type.…”
Section: Automated Defect Measurementmentioning
confidence: 99%
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“…In automatic visual inspection systems, traditional approaches use the bounding box or the horizontal cross-section of the detected defect to estimate the defect size [61,62]. For surface defects, this does not represent the actual defect size and thus they recommend using the largest dimension of all cross-sections of the detected defect [62]. Those authors developed a software tool to detect and to calculate the defect characteristics, including the defect size, shape, location and type.…”
Section: Automated Defect Measurementmentioning
confidence: 99%
“…The reason for this restriction is that the defect classification was not realised and is future work. Previous research showed that a rule-based framework could be used to classify defect types [62]. The descriptor that provides mathematical morphology introduce in Section 3.2.2 is also capable to extract additional characteristics, including information about the amount of missing material and edge deformation.…”
Section: Comments On the Decision Support Toolmentioning
confidence: 99%
“…For example, past work have noted the discrepancy between tool-reported defect size and physically measured defect size, however compensation strategies were not explored. 20 In this article, several experiments are preformed to quantify the variability and error associated with current HVM photomask inspection and write tools. Section 2 discusses in detail how an empirical 3-sigma error budget, β, is established.…”
Section: Introductionmentioning
confidence: 99%