2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC) 2016
DOI: 10.1109/pvsc.2016.7749915
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Automatic fault classification of photovoltaic strings based on an in situ IV characterization system and a Gaussian process algorithm

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Cited by 13 publications
(2 citation statements)
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“…These results show that calculating parameters based on domain knowledge allows for more stable and accurate results. If stringlevel control field measurements are not available to calculate δ I , control IV curves can be generated through either a diode model or Gaussian process regression [29], [30].…”
Section: Resultsmentioning
confidence: 99%
“…These results show that calculating parameters based on domain knowledge allows for more stable and accurate results. If stringlevel control field measurements are not available to calculate δ I , control IV curves can be generated through either a diode model or Gaussian process regression [29], [30].…”
Section: Resultsmentioning
confidence: 99%
“…Module-level in-situ I-V testers have been used for system monitoring [120], degradation analysis [112], and real-time fault detection [121]. Techniques have also been established for in-situ measurements at the array level, which have been used for automatic fault detection [122]. The rise of wireless sensors have enabled these measurements to be conducted in a more scalable way, as compared to wired sensors [123].…”
Section: Outdoor Characterization Applicationsmentioning
confidence: 99%