2015
DOI: 10.1109/tnano.2015.2392128
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Automatic-Patterned Sapphire Substrate Nanometrology Using Atomic Force Microscope

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Cited by 4 publications
(2 citation statements)
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“…However, STM could only scan samples with conductivity. Given this advantage, AFM has been extensively applied to the field of nanotechnology [4] and biological science [5]. Due to its operating principles, AFM can scan the samples made of conductor or insulator to acquire their high precise topographic images with a xyz-nanopositioning stage [3].…”
Section: Introductionmentioning
confidence: 99%
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“…However, STM could only scan samples with conductivity. Given this advantage, AFM has been extensively applied to the field of nanotechnology [4] and biological science [5]. Due to its operating principles, AFM can scan the samples made of conductor or insulator to acquire their high precise topographic images with a xyz-nanopositioning stage [3].…”
Section: Introductionmentioning
confidence: 99%
“…Due to its operating principles, AFM can scan the samples made of conductor or insulator to acquire their high precise topographic images with a xyz ‐nanopositioning stage . Given this advantage, AFM has been extensively applied to the field of nanotechnology and biological science .…”
Section: Introductionmentioning
confidence: 99%