Background errors in X-ray diffraction parameters

Mitra, G. B.; Misra, N. K.

doi:10.1088/0508-3443/17/10/310

Cited by 50 publications

(29 citation statements)

References 6 publications

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“…The reason for this discrepancy may be attributed to (a) the effect of the background and (b) the different assumptions involved in deriving (13) and (18). Mitra & Mishra (1966) have shown that the fourth moment is affected to a much greater extent than the variance by the background errors. Although the background was corrected with the method of Mitra & Mishra (1966) it is quite conceivable that some error may still remain uncorrected.…”

Section: Discussionmentioning

confidence: 99%

“…Mitra & Mishra (1966) have shown that the fourth moment is affected to a much greater extent than the variance by the background errors. Although the background was corrected with the method of Mitra & Mishra (1966) it is quite conceivable that some error may still remain uncorrected. Further, Mitra & Mishra (1966) have shown that the particle size and strain values would be different when determined from the different diffraction parameters.…”

Section: Discussionmentioning

confidence: 99%

“…As already described in the experimental details, the intensity measurements are correct within an accuracy of 1% and geometrical and spectral effects have been corrected for by the Stokes tal procedure involves measurements limited within a finite range. The background errors have been rendered very small, of the order of 'noise' or 'dark current' of the detector, by using the iterative method of Mitra & Mishra (1966). It is shown in Appendix IV that the finite range does not impose any apparent error in the deconvolution procedure.…”

Section: On Successively Differentiating the Above Equation We Getmentioning

confidence: 99%

“…Previous workers analysed the X-ray diffraction line profiles of only those reflections whose higher orders are also observable. The single-line technique which has been successfully used for the case ofmetals and alloys (Mitra & Mishra, 1966;Gangulee, 1974;Mitra & Choudhuri, 1974a, b;Mitra & Choudhuri, 1969) has not yet been applied to the case of polymers. However, Kulshreshtha and co-workers (Kulshreshtha, Dweltz & Radhakrishnan, 1971 ;Kulshreshtha, Kothari & Dweltz, 1971) have shown that fourth moment in conjunction with variance can be used as a single-line technique.…”

Section: Introductionmentioning

confidence: 99%

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Application of the method of moments to X-ray diffraction line profiles from paracrystals: Native cellulose fibres

Mitra¹,

Mukherjee²

1981

J Appl Cryst

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The 'microparacrystallite size' and 'distortion parameter' of delignified ramie, hemp and jute have been determined -with the assumption that these materials are paracrystalline in nature -with the second and fourth central moments of X-ray diffraction line profiles. A new method of curvature correction has been developed. Background as well as non-additivity corrections have also been accounted for. Theories of determining the 'microparacrystallite size' and the 'distortion parameter' from single reflections independently from each of these two central moments have been developed, and described. Determination of these two parameters for several directions in the samples studied have been based on the above work. It has been shown that, in conformity with the recent findings of Hosemann & Balta Calleja [Ber. Bunsenges. Phys. Chem. (1980), 84, 91], the larger the paracrystalline distortion the smaller is the 'microparacrystallite size'.

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Section: Discussionmentioning

confidence: 99%

Section: Discussionmentioning

confidence: 99%

Section: On Successively Differentiating the Above Equation We Getmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

Application of the method of moments to X-ray diffraction line profiles from paracrystals: Native cellulose fibres

Mitra¹,

Mukherjee²

1981

J Appl Cryst

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“…The conventional method to eliminate defocusing errors is via a correction function (UI) involving the pole figure scanning of a texture-free reference sample with a peak position and width close to that of the sample under investigation 1 [1]. Thus, for a given Bragg angle, the correction function is a measure of the change in the normalised intensity (UI = Iα=0-85°/ Iα=0°) with tilt angle [1,3,8]. Alternatively, analytical methods that correct for defocusing in the classical Schultz reflection geometry with incident crossed slits have also been developed by a number of authors [3,[9][10][11].…”

Section: Introductionmentioning

confidence: 99%

Correcting intensity loss errors in the absence of texture-free reference samples during pole figure measurement

Saleh

Gazder

2016

Materials Characterization

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Even with the use of X-ray polycapillary lenses, sample tilting during pole figure measurement results in a decrease in the recorded X-ray intensity. The magnitude of this error is affected by the sample size and/or the finite detector size. These errors can be typically corrected by measuring the intensity loss as a function of the tilt angle using a texture-free reference sample (ideally made of the same alloy as the investigated material). Since texture-free reference samples are not readily available for all alloys, the present study employs an empirical procedure to estimate the correction curve for a particular experimental configuration. It involves the use of real texture-free reference samples that pre-exist in any X-ray diffraction laboratory to first establish the empirical correlations between X-ray intensity, sample tilt and their Bragg angles and thereafter generate correction curves for any Bragg angle. It will be shown that the empirically corrected textures are in very good agreement with the experimentally corrected ones. AbstractEven with the use of X-ray polycapillary lenses, sample tilting during pole figure measurement results in a decrease in the recorded X-ray intensity. The magnitude of this error is affected by the sample size and/or the finite detector size. These errors can be typically corrected by measuring the intensity loss as a function of the tilt angle using a texture-free reference sample (ideally made of the same alloy as the investigated material). Since texture-free reference samples are not readily available for all alloys, the present study employs an empirical procedure to estimate the correction curve for a particular experimental configuration. It involves the use of real texture-free reference samples that pre-exist in any X-ray diffraction laboratory to first establish the empirical correlations between X-ray intensity, sample tilt and their Bragg angles and thereafter generate correction curves for any Bragg angle. It will be shown that the empirically corrected textures are in very good agreement with the experimentally corrected ones.

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