Basic properties of dynamic force spectroscopy with the scanning force microscope in experiment and simulation

Classification of Scanning Probe Microscopies

“…Although in the TM-AFM the tip is not permanently in contact with the sample while scanning, it is still suggested to consider it as a CM-SFM technique and to use the term AFM, since intermittent contact occurs during imaging. Regarding the problem of transition from noncontact to contact the reader is referred to [77][78][79]. Due to the fact that shear forces are eliminated and vertical forces are reduced significantly in the TM-AFM, it is especially (but not only) advantageous for investigating sensitive materials (e.g.…”

“…This term, which rather exists for historical reasons, is not recommended for methods obtaining information through operation in the pure noncontact (adhesive) regime (we have defined AFM as a technique utilizing interatomic short-range interaction forces in the repulsive mode, which implies that contact occurs). Again, for a discussion of the transition from noncontact to contact the reader is referred to [77][78][79].…”

Nanotechnology: a systems and control approach

“…Much of the research on tapping-mode dynamics has revolved around solving nonlinear differential equations numerically (see [8] and [9]). As mentioned earlier even though they predict experimentally observed behavior, they fail to capture the limitations and important characteristics in the operation of tapping-mode AFM.…”

“…[8] was used where advanced models for tip-sample interaction were employed. The tip-sample interaction model given in Ref.…”

“…Although micro-cantilever based devices have been utilized ubiquitously in various applications, the dynamics of the cantilever-sample interaction is significantly complex and considerable research effort is being placed at deciphering this interaction. Most of the re search effort is towards developing sophisticated and often involved physical models of the tip-sample interaction ( [8], [9], [10]). This has helped provide insights into the various physical sources of the tip-sample interaction force.…”