2012 International Electron Devices Meeting 2012
DOI: 10.1109/iedm.2012.6479118
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Benchmarking and improving III-V Esaki diode performance with a record 2.2 MA/cm<sup>2</sup> peak current density to enhance TFET drive current

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Cited by 24 publications
(22 citation statements)
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“…Next, In Fig. 4.2(d), we show the current and conductance for an InAs homojunction diode at two different doping levels (NA = 1.8x10 19 ; ND = 3x10 18 and 1x10 19 ) [23]. When the n-side doping is decreased from 1×10 19 /cm 3 to 3×10 18 /cm 3 the absolute conductance I/V swing improves from 570mV to only 180mV/decade falling far short of our goal.…”
Section: Measuring the Electronic Transport Band Edge Steepnessmentioning
confidence: 99%
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“…Next, In Fig. 4.2(d), we show the current and conductance for an InAs homojunction diode at two different doping levels (NA = 1.8x10 19 ; ND = 3x10 18 and 1x10 19 ) [23]. When the n-side doping is decreased from 1×10 19 /cm 3 to 3×10 18 /cm 3 the absolute conductance I/V swing improves from 570mV to only 180mV/decade falling far short of our goal.…”
Section: Measuring the Electronic Transport Band Edge Steepnessmentioning
confidence: 99%
“…In the next section we suggest some remedies. [21], (c) a Germanium diode [22], and (d) InAs diodes [23] are plotted. At V=0, the current diverges on a log plot and so the logarithmic slope is meaningless.…”
Section: Measuring the Electronic Transport Band Edge Steepnessmentioning
confidence: 99%
“…The oscillations between the peak and valley current are a common measurement artefact [4,7,8]. Peak voltage (V P ) settles between 0.25 and 0.3 V, as expected for an InAs/GaSb heterojunction in this doping range [5]. Values for J P and PVCR were extracted from over 100 devices.…”
mentioning
confidence: 99%
“…Structure: The Esaki diode structure was designed to have a moderately high peak current density (J P ) and peak-to-valley current ratio (PVCR), which maximises the tolerable defect limits as exhibited in prior reports [4]. Doping levels for samples GaSb-TD1 and Si-TD2 were based on designs in Pawlik et al [5] but with a 3 nm i-layer consisting of GaSb. Fig.…”
mentioning
confidence: 99%
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