2008
DOI: 10.1007/s10836-007-5041-3
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Bilateral Testing of Nano-scale Fault-Tolerant Circuits

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Cited by 7 publications
(4 citation statements)
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“…As long as no more than one of the modules fails, the output of the voter is the same as the outputs of the two other fault-free modules. The degree of fault tolerance is defined as the maximum number of faults that can be tolerated in a system [42]. Fig.…”
Section: Spatial Redundancy Against Fbamentioning
confidence: 99%
See 2 more Smart Citations
“…As long as no more than one of the modules fails, the output of the voter is the same as the outputs of the two other fault-free modules. The degree of fault tolerance is defined as the maximum number of faults that can be tolerated in a system [42]. Fig.…”
Section: Spatial Redundancy Against Fbamentioning
confidence: 99%
“…In order to show the tolerance of the resistive bridging faults, we have used and adapted the case given by Fang and Hsiao [42] (when double stuck-at defects affect two different modules). In this work, we consider that two resistive bridge faults F 1 and F 2 affect two different modules of the TMR.…”
Section: Defects and Fault Tolerancementioning
confidence: 99%
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“…To increase the yield for future VLSI systems, fault tolerant architectures have been proposed as a potential solution [1]. Fault tolerant architectures are commonly used to tolerate on-line faults, i.e.…”
Section: Introductionmentioning
confidence: 99%