“…The fault tolerance of transient faults is discussed also by Zhang et al [46] and Kuang et al [47]. However, these works do not address the security and fault tolerance evaluation of TMR secure systems against resistive bridges defect, which are still the dominant defect for manufacturing process [48] and are more difficult to detect in a TMR structure due to the presence of redundancy [42]. The aim of our simulations is to evaluate the fault-tolerance and the security of A lot of work has focused on fault models of resistive bridge defects [35,36] and throughout our simulations, we used the one proposed in [36], which describes the resistive bridge fault impact considering the static and dynamic behaviour of the circuit.…”