2019 International Conference on Electronics Packaging (ICEP) 2019
DOI: 10.23919/icep.2019.8733511
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Bonding of Copper Pillars Using Electroless Cu Plating

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Cited by 8 publications
(1 citation statement)
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“…The growth of electroless-plated copper around the edges of the pillars hindered the movement of the copper ions toward the center, causing voids between the pillars. Similar issues have been highlighted in previous studies [9,39] and can be resolved by adopting dome-shaped pillars instead of flat-topped pillars [9]. The average pillar height was determined by measuring three samples using a 3D laser scanning microscope.…”
Section: Cross Section Of Electroless-plated Cumentioning
confidence: 80%
“…The growth of electroless-plated copper around the edges of the pillars hindered the movement of the copper ions toward the center, causing voids between the pillars. Similar issues have been highlighted in previous studies [9,39] and can be resolved by adopting dome-shaped pillars instead of flat-topped pillars [9]. The average pillar height was determined by measuring three samples using a 3D laser scanning microscope.…”
Section: Cross Section Of Electroless-plated Cumentioning
confidence: 80%