2013
DOI: 10.1016/j.solmat.2013.07.010
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Breaking mechanism of indium tin oxide and its effect on organic photovoltaic cells

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Cited by 15 publications
(11 citation statements)
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“…As expected, the ITO film failed to maintain the flexibility: R s changed by 314% as early as after the first ten cycles. Indeed, ITO is brittle and tends to form cracks that block the electrical pathways upon bending . In contrast, the resistance of MoO x /Au‐seed/Cu/MoO x remained nearly unchanged even after 1000 bending cycles.…”
Section: Resultsmentioning
confidence: 99%
“…As expected, the ITO film failed to maintain the flexibility: R s changed by 314% as early as after the first ten cycles. Indeed, ITO is brittle and tends to form cracks that block the electrical pathways upon bending . In contrast, the resistance of MoO x /Au‐seed/Cu/MoO x remained nearly unchanged even after 1000 bending cycles.…”
Section: Resultsmentioning
confidence: 99%
“…Electrical resistance measurement and cracking observation were immediately conducted after 0, 2, and 24 h of bending [40]. The results show that cracks appear at 20 mm-radius cylinder and smaller, in conjunction with slight degradation in the conductivity of ITO thin film [40]. The exemplified results, described above, indicate that the electrical performance of ITO films is degraded under certain bending conditions.…”
Section: Introductionmentioning
confidence: 91%
“…Their results show that the critical bending radii of 20, 50, 100, and 150 nm-thick ITO electrodes are 4.5, 4.5, 6, and 6 mm, respectively [38]. Leppänen et al [40] investigated the mechanical and electrical behavior of an ITO thin film under static bending at different curvatures. Samples were bent from 53 mm to 15 mm radius of curvature [40].…”
Section: Introductionmentioning
confidence: 99%
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