Bridging the gap between conventional and video-speed scanning probe microscopes

Fleming, Andrew J.; Kenton, Brian J.; Leang, Kam K.

doi:10.1016/j.ultramic.2010.04.016

Cited by 96 publications

(67 citation statements)

References 49 publications

Supporting

Mentioning

Contrasting

Unclassified

Order By: Relevance

“…It is shown in [18] that the maximum vertical feedback bandwidth with an integral controller is limited by the first Z-axis resonance frequency of the nanopositioner. A nanopositioner system with an inadequate vertical feedback bandwidth is not fast enough to track sharp features, which leads to the "smudging" effect of the feature edges [19].…”

Section: Introductionmentioning

confidence: 99%

Design, Modeling, and FPAA-Based Control of a High-Speed Atomic Force Microscope Nanopositioner

Yong

Bhikkaji

Moheimani

2013

IEEE/ASME Trans. Mechatron.

126

View full text Add to dashboard Cite

Abstract-An XYZ nanopositioner is designed for fast the atomic force microscopy. The first resonant modes of the device are measured at 8.8, 8.9, and 48.4 kHz along the X-, Y-, and Z-axes, respectively, which are in close agreement to the finite-element simulations. The measured travel ranges of the lateral and vertical axes are 6.5 μm × 6.6 μm and 4.2 μm, respectively. Actuating the nanopositioner at frequencies beyond 1% of the first resonance of the lateral axes causes mechanical vibrations that result in degradation of the images generated. In order to improve the lateral scanning bandwidth, controllers are designed using the integral resonant control methodology to damp the resonant modes of the nanopositioner and to enable fast actuation. Due to the large bandwidth of the designed nanopositioner, a field programmable analog array is used for analog implementation of the controllers. Highresolution images are successfully generated at 200-Hz line rate with 200×200 pixel resolution in closed loop.Index Terms-Field-programmable analog array (FPAA), flexure-guided positioners, high-speed atomic force microscope (AFM), integral resonant control (IRC), nanopositioner, piezoelectric actuators.

show abstract

Section: Introductionmentioning

confidence: 99%

Design, Modeling, and FPAA-Based Control of a High-Speed Atomic Force Microscope Nanopositioner

Yong

Bhikkaji

Moheimani

2013

IEEE/ASME Trans. Mechatron.

126

View full text Add to dashboard Cite

show abstract

“…An anti-windup scheme based on conditional integrators practically eliminated large transients and long settling times that occurred when signals in the system saturated. Also, by optimally tuning the reconstruction and antialiasing filters, that always are present when implementing a controller in discrete time, bandwidth of the closed-loop system was increased by more than an order of magnitude, It is interesting to note that by utilizing the reconstruction and anti-aliasing filters in this fashion, one obtains very similar results as when applying integral resonance control [Fleming et al, 2009], but with the added advantage of using equipment already present in the signal chain.…”

Section: Conclusion For a Pimentioning

confidence: 99%

PI2-Controller Applied to a Piezoelectric Nanopositioner Using Conditional Integrators and Optimal Tuning

Eielsen

Burger

Gravdahl

et al. 2011

IFAC Proceedings Volumes

View full text Add to dashboard Cite

For tracking control of nanopositioning stages using piezoelectric actuators, controllers with integral action can be employed to robustly track a reference in the presence of hysteresis, creep, and plant parametric uncertainties. In any practical configuration of instrumentation for this application, saturations will be present. Thus, a controller with integral action is prone to windup, which typically cause large transients and long settling times, and will in general degrade performance and potentially damage equipment. In this paper it is demonstrated that conditional integrators provides a very accessible and convenient framework for introducing anti-windup for any order integral controller, and the effectiveness is verified experimentally. Also, the influence reconstruction and anti-aliasing filters have on the stability limits for PI and PI 2 controllers is investigated, and a novel tuning procedure is proposed in order to obtain the best performance for the overall system. It is demonstrated experimentally that optimal tuning can damp resonances and increase bandwidth.

show abstract

“…To overcome this adverse effect, modified lateral scan waves, such as sinusoidal, 19 spiral, 23 cycloid, 24 and Lissajous 25 waves have been proposed. Sinusoidal scanning is the simplest solution, but both the left and right end areas of an image are greatly distorted.…”

Section: A Vibration Damping For X-scanmentioning

confidence: 99%

“…This rate corresponds to a scan speed of 6.8 mm/s, which is faster than the previous fastest record. 19 To demonstrate the capability and usefulness of this new wide-area scanner in bioimaging, we observed the bacteriolysis process of Bacillus (B.) subtilis subjected to lysozyme and the dynamic processes of actin retrograde flow and We also showed that this wide-area scanner can be used to image proteins in a narrow area with an imaging rate comparable to that achieved by our fast smallarea scanner.…”

Section: Introductionmentioning

confidence: 96%

See 1 more Smart Citation

Wide-area scanner for high-speed atomic force microscopy

Watanabe

Uchihashi

Kobashi

et al. 2013

Review of Scientific Instruments

View full text Add to dashboard Cite

High-speed atomic force microscopy (HS-AFM) has recently been established. The dynamic processes and structural dynamics of protein molecules in action have been successfully visualized using HS-AFM. However, its maximum scan ranges in the X-and Y-directions have been limited to ∼1 μm and ∼4 μm, respectively, making it infeasible to observe the dynamics of much larger samples, including live cells. Here, we develop a wide-area scanner with a maximum XY scan range of ∼46 × 46 μm 2 by magnifying the displacements of stack piezoelectric actuators using a leverage mechanism. Mechanical vibrations produced by fast displacement of the X-scanner are suppressed by a combination of feed-forward inverse compensation and the use of triangular scan signals with rounded vertices. As a result, the scan speed in the X-direction reaches 6.3 mm/s even for a scan size as large as ∼40 μm. The nonlinearity of the X-and Y-piezoelectric actuators' displacements that arises from their hysteresis is eliminated by polynomial-approximation-based open-loop control. The interference between the X-and Y-scanners is also eliminated by the same technique. The usefulness of this wide-area scanner is demonstrated by video imaging of dynamic processes in live bacterial and eukaryotic cells.

show abstract

Bridging the gap between conventional and video-speed scanning probe microscopes

Cited by 96 publications

References 49 publications

Design, Modeling, and FPAA-Based Control of a High-Speed Atomic Force Microscope Nanopositioner

Design, Modeling, and FPAA-Based Control of a High-Speed Atomic Force Microscope Nanopositioner

PI2-Controller Applied to a Piezoelectric Nanopositioner Using Conditional Integrators and Optimal Tuning

Wide-area scanner for high-speed atomic force microscopy

Contact Info

Product

Resources

About