Built-in self-diagnosis exploiting strong diagnostic windows in mixed-mode test

Abstract

Efficient diagnosis procedures are crucial both for volume and for in-field diagnosis. In either case the underlying test strategy should provide a high coverage of realistic fault mechanisms and support a lowcost implementation. Built-in self-diagnosis (BISD) is a promising solution, if the diagnosis procedure is fully in line with the test flow. However, most known BISD schemes require multiple test runs or modifications of the standard scan-based test infrastructure. Some recent schemes circumvent these problems, but they focus on deterministic patterns to limit the storage requirements for diagnostic data. Thus, they cannot exploit the benefits of a mixed-mode test such as high coverage of non-target faults and reduced test data storage. This paper proposes a BISD scheme using mixed-mode patterns and partitioning the test sequence into "weak" and "strong" diagnostic windows, which are treated differently during diagnosis. As the experimental results show, this improves the coverage of non-target faults and enhances the diagnostic resolution compared to state-of-the-art approaches. At the same time the overall storage overhead for input and response data is considerably reduced. Preprint General Copyright NoticeThis article may be used for research, teaching and private study purposes. Any substantial or systematic reproduction, re-distribution, re-selling, loan or sub-licensing, systematic supply or distribution in any form to anyone is expressly forbidden. This is the author's "personal copy" of the final, accepted version of the paper published by IEEE. Abstract-Efficient diagnosis procedures are crucial both for volume and for in-field diagnosis. In either case the underlying test strategy should provide a high coverage of realistic fault mechanisms and support a low-cost implementation. Built-in self-diagnosis (BISD) is a promising solution, if the diagnosis procedure is fully in line with the test flow. However, most known BISD schemes require multiple test runs or modifications of the standard scan-based test infrastructure. Some recent schemes circumvent these problems, but they focus on deterministic patterns to limit the storage requirements for diagnostic data. Thus, they cannot exploit the benefits of a mixed-mode test such as high coverage of non-target faults and reduced test data storage. This paper proposes a BISD scheme using mixed-mode patterns and partitioning the test sequence into "weak" and "strong" diagnostic windows, which are treated differently during diagnosis. As the experimental results show, this improves the coverage of non-target faults and enhances the diagnostic resolution compared to state-of-the-art approaches. At the same time the overall storage overhead for input and response data is considerably reduced.

Diagnosis of multiple faults with highly compacted test responses

“…Now, if the candidate set C contains for each active real faults f i a representative candidate f i producing the same signature as f i , we can substitute the right hand side of equation 8 and find a solution for: E e f1,··· , e fq := c 1 E f1 ⊕· · ·⊕c q E fq ⊕c q+1 E fq+1 · · ·⊕c k E f k (9) where c i = 0 for i > q.…”

“…• Two faults belong to the same list if they explain at least one common pattern • A given fault can only belong to a single list • Faults in the same list are ordered according to the procedure described in section IV-B As shown in Algorithm 1, non-SLAT signatures are explained iteratively (lines [2][3][4][5][6][7][8][9][10][11][12][13][14]. After initial SLAT diagnosis, the procedure is repeated Q times.…”

“…During production test this infrastructure is mandatory for economic reasons, and it is expensive to switch it off for diagnostic purposes. While state-of-the-art diagnostic solutions support the compaction of scan tests [4], [5], other applications like, for example, system test [6], [7] and field return analysis [8], [9] make use of built-in self-test (BIST) infrastructure to gather failure response data. For such applications with higher compaction requirements, the diagnosis of multiple faults is still an open challenge.…”

Non-intrusive integration of advanced diagnosis features in automotive E/E-architectures

“…However, a single signature does not provide enough information to enable semiconductor diagnosis. Recently, the STUMPS architecture has been extended in order to enhance its diagnostic capabilities [9] and efficient logic diagnosis algorithms have emerged that require only a few test signatures [10]. The response and fail data in Fig.…”

Built-in self-diagnosis targeting arbitrary defects with partial pseudo-exhaustive test

“…Nevertheless, applying this scheme to long test sequences would result in very high storage requirements for the response data. BISD for LBIST and for mixed-mode BIST with long pseudo-random sequences needs additional strategies for reducing the response data [1] [6]. As the sequences for P-PET are typically much longer than the pseudo-random sequences in LBIST or mixed-mode BIST, it is even more challenging to limit the storage requirements for response data.…”