2013
DOI: 10.4028/www.scientific.net/amm.404.77
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Bump Height at Low Temperature Analysis

Abstract: The effects of chemical bath time in response to the bump height in electroless nickel immersion gold (ENIG) process was investigated. This paper presents the correlation between electroless process time, immersion gold process time and the bump height. A certain bump height need to be achieved in order to create acceptable solder bumps for reflow process. The study was done using a full factorial design of experiment (DOE). The DOE matrix is made of two levels with two factors. Analysis was done by plotting t… Show more

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Cited by 2 publications
(3 citation statements)
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“…The measured dE /dx in this figure clearly distinguishes the Compton electrons fully contained in the TPC from the backgrounds, and resultantly enables us to remove most of the backgrounds without loss of Compton events by applying cuts. The red-dashed line in this figure is the empirical formula of dE /dx , which is approximately proportional to E 1.72 (Sauli 1977), for recoil electrons fully contained in the TPC. The region within E 1.72±0.22 contains ∼95% of Compton events inside (dE /dx cut), as supported by the simulation result.…”
Section: Basic Performance Of the Smile-iimentioning
confidence: 99%
“…The measured dE /dx in this figure clearly distinguishes the Compton electrons fully contained in the TPC from the backgrounds, and resultantly enables us to remove most of the backgrounds without loss of Compton events by applying cuts. The red-dashed line in this figure is the empirical formula of dE /dx , which is approximately proportional to E 1.72 (Sauli 1977), for recoil electrons fully contained in the TPC. The region within E 1.72±0.22 contains ∼95% of Compton events inside (dE /dx cut), as supported by the simulation result.…”
Section: Basic Performance Of the Smile-iimentioning
confidence: 99%
“…It depends on the transit of elecrrons from their generation point to the collecting electrode. The spread on the duration of transit leads to a finite time resolution of the detector [2,3]. The main two factors that contribute to the spread are the statistics and distribution of the primary electrons and their diffusion in gas medium.…”
Section: Introductionmentioning
confidence: 99%
“…From event to event, the electron is not produced at the same distance from the read-out plane of the detector under consideration. The general expression for the space distribution of the electron-ion pair j, closest to the read-out plane, whenN P is the average number of pairs produced, is obtained as follows [2,3]:…”
Section: Introductionmentioning
confidence: 99%