Calculation of correlations in the surface structure of solids

Mursalov, S. M.; Bodyagin, N. V.; Vikhrov, S. P.

doi:10.1134/1.1307808

Cited by 3 publications

(3 citation statements)

References 2 publications

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“…According to the work (Lu et al, 2012) the various time-temperature modes of IR-annealing and the modifying additive concentration are the technological parameters that form the unique structure of a polymer composite Ag-containing PAN film and lead to essential change of the film surface morphology. It have been established that the best gas-sensitivity shows the films with obvious self-organization processes and presence of structures with several correlation dimensions and high value of average mutual information (Vikhrov et al, 2012) or mean reciprocal information (Mursalov et al, 2000).…”

Section: Discussionmentioning

confidence: 99%

“…The film surface images received by means of microscopy can serve as a starting point for the analysis by methods of nonlinear dynamics and the information theory (Vikhrov et al, 2005, Bodyagin et al, 1997, Mursalov et al, 2000, Vikhrov et al, 2012, Avacheva et al, 2008. The processes in solid-state formation are characterized by the basic features of self-organizing systems (Vikhrov et al, 2005).…”

Section: Introductionmentioning

confidence: 99%

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Multifractal Detrended ﬂuctuation Analysis in Examining Surface Properties of the Gas-Sensing Metal-Containing Polyacrylonitrile

Semenistaya¹,

Plugotarenko²,

Петров³

2015

MAS

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A possibility of applying the multifractal detrended fluctuation analysis (MF-DFA) to the investigation of the gas-sensitivity dependence on the thin-films surface morphology formed using different technological parameters of annealing has been studied. Methods of analyzing the dynamics of complex systems are modified so as to investigate the structure of the metal-containing polyacrylonitrile (PAN) thin films. The long-range power-law correlation in structure of the studied film surface has been studied. The analysis have showed that the time-temperature annealing modes increasing brings to the Hurst parameter value increasing that points to a long-range power-law correlation in structure of the studied film surface.

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Section: Discussionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Multifractal Detrended ﬂuctuation Analysis in Examining Surface Properties of the Gas-Sensing Metal-Containing Polyacrylonitrile

Semenistaya¹,

Plugotarenko²,

Петров³

2015

MAS

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“…According to the embedding method of F. Takens [3], any signal from the system contains information about all processes within it. Consequently, for disordered materials based on the surface topography, it is possible to study correlations [4] in the structure at the level of average order.…”

Section: Introductionmentioning

confidence: 99%

Study of Correlations in the Relief of Complex Surfaces Using the Example of Amorphous Hydrogenated Silicon

Rybina

2024

Eurasian phys. tech. j.

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Abstract. The results of a study of correlations in the surface relief of amorphous hydrogenated silicon using the methods of average mutual information andtwo-dimensional detrended fluctuation analysis by identifying its structural components using the scale-space technique are presented. The experimental samples were model and real surfaces of amorphous hydrogenated silicon. The model surface was formed bysuperimposing the surfaces "Stochastic fractal", "Particles" and "Gaussian noise". The values of the scaling index were obtained from the dependences of the fluctuation function on the scale, as well as the values of the average mutual information and themaximum mutual information were calculated. A comparative analysis of the correlation dependencies of the model and the real surfaces of amorphous hydrogenated silicon has shown that the model surface "Particles" is closest to the surface structure of theexperimental sample in terms of its characteristics. It was found that particles with dimensions of 65±10 nm are present in the surface structure of the experimental sample.

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Revealing the surface interface correlations in a-Si:H films by 2D detrended fluctuation analysis

2013

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Calculation of correlations in the surface structure of solids

Cited by 3 publications

References 2 publications

Multifractal Detrended ﬂuctuation Analysis in Examining Surface Properties of the Gas-Sensing Metal-Containing Polyacrylonitrile

Multifractal Detrended ﬂuctuation Analysis in Examining Surface Properties of the Gas-Sensing Metal-Containing Polyacrylonitrile

Study of Correlations in the Relief of Complex Surfaces Using the Example of Amorphous Hydrogenated Silicon

Revealing the surface interface correlations in a-Si:H films by 2D detrended fluctuation analysis

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