2016
DOI: 10.1109/jsen.2015.2480842
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Capacitance and Force Computation Due to Direct and Fringing Effects in MEMS/NEMS Arrays

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Cited by 22 publications
(12 citation statements)
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“…The applied voltage was swept at the graphene beam and 0 V of fixed bias was applied to the gold bottom electrode to analyze the electrical field distribution at different voltages, while other boundaries are electrically insulated. Besides, the voltage potential ( V ) and the electrical field ( E ) in the vacuum condition can be acquired by solving the Poisson’s equation as given by [ 36 ]: −∇·(ε·∇ V ) = 0, where the derivatives are taken with respect to the spatial coordinates. This numerical model represents the electrical potential and its derivatives on a mesh, which is moving with respect to the spatial frame.…”
Section: Fem Simulation Results and Discussionmentioning
confidence: 99%
“…The applied voltage was swept at the graphene beam and 0 V of fixed bias was applied to the gold bottom electrode to analyze the electrical field distribution at different voltages, while other boundaries are electrically insulated. Besides, the voltage potential ( V ) and the electrical field ( E ) in the vacuum condition can be acquired by solving the Poisson’s equation as given by [ 36 ]: −∇·(ε·∇ V ) = 0, where the derivatives are taken with respect to the spatial coordinates. This numerical model represents the electrical potential and its derivatives on a mesh, which is moving with respect to the spatial frame.…”
Section: Fem Simulation Results and Discussionmentioning
confidence: 99%
“…For the electric field analysis at different voltages, a constant bias of 0 V was applied to the bottom electrode (Au) and the voltage applied at the top electrode (graphene beam) was swept. The potential, V , and the electric field, E , in the free space can be obtained by solving Poisson’s equation [ 28 ]. Figure 6 a shows the cross-sectional view of the electric field distribution across the center of the NEM switch for the applied voltage of 1 V to the bottom electrode.…”
Section: Finite Element Methods Simulation Results and Discussionmentioning
confidence: 99%
“…When the fringe effect is taken into consideration, the electric charge densities also exist along the edges of the plates and the distribution is not uniform; thus, the calculation of the plate capacitance becomes complex. According to the existing literature, a few empirical formulas have been proposed using different methods to calculate the capacitance of the parallel plate capacitor when the fringe effect is under consideration [ 27 , 28 , 29 ]; however, there is no general method for calculating it accurately. Nishiyama et al [ 30 ] presented an empirical formula to calculate the capacitance of parallel plate ring capacitors: …”
Section: Detection Modementioning
confidence: 99%