Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium
DOI: 10.1109/vtest.1993.313302
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Carafe: an inductive fault analysis tool for CMOS VLSI circuits

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Cited by 152 publications
(31 citation statements)
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“…Although advances in test technology are now required to facilitate the continued growth of composite microfluidic systems based on droplet flow, very limited work on the testing for such "digital" microfluidic biochips has been reported to date. We can classify the faults in these systems as being either catastrophic or parametric, along the line of fault classification for analog circuits [51]. Catastrophic (hard) faults lead to a complete malfunction of the system, while parametric (soft) faults cause a deviation in the system performance.…”
Section: B Proposed Design Methodology: Top-down 1) Overviewmentioning
confidence: 99%
“…Although advances in test technology are now required to facilitate the continued growth of composite microfluidic systems based on droplet flow, very limited work on the testing for such "digital" microfluidic biochips has been reported to date. We can classify the faults in these systems as being either catastrophic or parametric, along the line of fault classification for analog circuits [51]. Catastrophic (hard) faults lead to a complete malfunction of the system, while parametric (soft) faults cause a deviation in the system performance.…”
Section: B Proposed Design Methodology: Top-down 1) Overviewmentioning
confidence: 99%
“…We assume that the initial candidate faults are extracted from layout data using a certain previously proposed method like [2]- [4]. Also a scan based flush test application technique is assumed to be used, where scan FFs are always in the scan shift mode, and test data are applied from the scan input and shifted out of the scan output [5].…”
Section: Outputsmentioning
confidence: 99%
“…Therefore, we classify the faults in these systems as being either catastrophic or parametric, along the line of fault classification for analog circuits [22]. Catastrophic (hard) faults lead to a complete malfunction of the system, while parametric (soft) faults cause a deviation in the system performance.…”
Section: Classification Of Faults In Droplet-based Microelectroflmentioning
confidence: 99%