1980
DOI: 10.1109/t-ed.1980.19837
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CCD Readout of infrared hybrid focal-plane arrays

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Cited by 28 publications
(5 citation statements)
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“…For an ideal system, with increasing the voltage V G , when the injection efficiency h I nearly rea− ches unity, for the readout−integrated current we have I In »I ph , and the value of D*, limited by the photodiode current noise Q 3 , coincides with the theoretical limit of detectivity in BLIP operation (D BLIP * ). In the latter case, the characterristics of IR FPAs based on DI readout circuits can be evaluated using the generally accepted simplifications [2,3]. For multi−element IR FPAs, it is significant that the detectivity D* and the current I In at V G > 1.22 V are almost independent of V G .…”
Section: Inmentioning
confidence: 99%
See 1 more Smart Citation
“…For an ideal system, with increasing the voltage V G , when the injection efficiency h I nearly rea− ches unity, for the readout−integrated current we have I In »I ph , and the value of D*, limited by the photodiode current noise Q 3 , coincides with the theoretical limit of detectivity in BLIP operation (D BLIP * ). In the latter case, the characterristics of IR FPAs based on DI readout circuits can be evaluated using the generally accepted simplifications [2,3]. For multi−element IR FPAs, it is significant that the detectivity D* and the current I In at V G > 1.22 V are almost independent of V G .…”
Section: Inmentioning
confidence: 99%
“…In the pre− sent study, these dependences were calculated using the maximum values of D * (V G ). For multi−element IR FPAs, because of the technology−defined scatter of threshold volt− ages under the input gates of readouts, one fails to ensure the biasing of photodiodes with optimal voltages [2,19]. The non−uniformity of threshold voltages gives rise to a residual fixed−pattern noise (RFPN) and, for some portion of photodetector channels in IR FPA, to a considerable reduc− tion of D * and NETD figures, which can be even more dra− matic than that in Figs.…”
Section: Calculated Characteristics Of Ir Fpasmentioning
confidence: 99%
“…Charge collection in direct injection [13] and buffered direct injection [14,15] topology is carried out at the drain of the inject MOS transistor. The direct injection approach has the advantage of simplicity and high injection efficiencies.…”
Section: Adaptation and Charge Collectionmentioning
confidence: 99%
“…The injection efficiency is approximately given by 21,22 ͑is this only true for direct injection ROIC?͒…”
Section: Comparison Of Qdips and Hgcdte Devicesmentioning
confidence: 99%