2006 International Conference on Electronic Materials and Packaging 2006
DOI: 10.1109/emap.2006.4430609
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Challenges in Stacked CSP Packaging Technology

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Cited by 5 publications
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“…Studies have also shown that bonding at different locations of the overhang results in different bending stresses and deflection [11]. Many studies have been conducted which investigates the effect of changing the overhang length on die stress and deflection [10]- [13]. The studies highlighted above also investigated the effect of increasing die thickness on the stress and deflection of the die [10]- [13].…”
Section: Introductionmentioning
confidence: 99%
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“…Studies have also shown that bonding at different locations of the overhang results in different bending stresses and deflection [11]. Many studies have been conducted which investigates the effect of changing the overhang length on die stress and deflection [10]- [13]. The studies highlighted above also investigated the effect of increasing die thickness on the stress and deflection of the die [10]- [13].…”
Section: Introductionmentioning
confidence: 99%
“…Many studies have been conducted which investigates the effect of changing the overhang length on die stress and deflection [10]- [13]. The studies highlighted above also investigated the effect of increasing die thickness on the stress and deflection of the die [10]- [13]. This study aims to determine the stress and deflection of a stacked die by changing the bonding positions instead of changing the dimensions of the overhang.…”
Section: Introductionmentioning
confidence: 99%