Changes in GaAs electroluminescent diodes induced by continuous operation

Jacobus, W.N.

doi:10.1016/0038-1101(67)90083-4

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1968

1980

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Cited by 5 publications

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“…In this paper, we demonstrate an even simpler procedure based on the initial-measurement of the forward I-V characteristic.-The model is empirical in the sense that it does not involve the atomiclevel mechanism ultimately responsible for the degradation (2). It is, however, fundamental in the sense that the degradation relationship is derived as a natural consequence of the well-documented (3)(4)(5)(6) change in the I-V characteristic with time.…”

Section: Introductionmentioning

confidence: 96%