2007
DOI: 10.1143/jjap.46.5747
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Characteristics of Transmission Lines on Silicon-on-Metal and Silicon-on-Quartz

Abstract: In this paper, we describe the effect of silicon substrate thickness on the characteristics of transmission lines fabricated using complementary metal-oxide-semiconductor (CMOS) technology. The S-parameters of the transmission lines on silicon-onmetal (SoM) and silicon-on-quartz (SoQ) are measured. The inductance of a microstrip line on SoM decreases as silicon substrate thickness is reduced, while that on SoQ is nearly constant for various substrate thicknesses. This fact is explained by the magnetic energy o… Show more

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Cited by 1 publication
(4 citation statements)
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“…For the next step, we calculate the energy difference ÁE and the energy loss E loss of the spiral inductor from the extracted model parameters in order to investigate the dependences of the energies of the inductor on SoM and SoQ on silicon substrate thickness. In our previous study, 5) the behaviors of the electromagnetic energy and energy loss simulated using a full-wave solver are similar to those of the energies and energy loss estimated using the extracted model parameters. Therefore, in this study, we discuss behaviors of electromagnetic energies and energy loss using the extracted model parameters.…”
Section: Effects Of Silicon Substrate Thickness On Characteristics Of...supporting
confidence: 55%
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“…For the next step, we calculate the energy difference ÁE and the energy loss E loss of the spiral inductor from the extracted model parameters in order to investigate the dependences of the energies of the inductor on SoM and SoQ on silicon substrate thickness. In our previous study, 5) the behaviors of the electromagnetic energy and energy loss simulated using a full-wave solver are similar to those of the energies and energy loss estimated using the extracted model parameters. Therefore, in this study, we discuss behaviors of electromagnetic energies and energy loss using the extracted model parameters.…”
Section: Effects Of Silicon Substrate Thickness On Characteristics Of...supporting
confidence: 55%
“…We measured the S-parameters of the spiral inductors in two cases: silicon-on-metal (SoM) and silicon-on-quartz (SoQ). 5) One is the case of SoM where the samples are directly mounted on a metal plate connected to a DC ground. The cross-sectional view is the same view shown in Fig.…”
Section: Measurementsmentioning
confidence: 99%
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