Characterization and optimization of NO-nitrided gate oxide by RTP

Sun, S.C.; Chen, C.H.; Yen, Daniel; Lin, Chuan

doi:10.1109/iedm.1995.499312

Cited by 3 publications

(1 citation statement)

References 9 publications

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“…The distortion of the nitrate process will influence the lifetime of the device produced from that wafer. The annealing time or the temperature used during the nitrate layering process can also be used to vary the resilience to HCI [9], [26].…”

Section: Hci Trojanmentioning

confidence: 99%

Hardware Trojan by Hot Carrier Injection

Shiyanovskii,

Wolff,

Papachristou

et al. 2009

Preprint

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This paper discusses how hot carrier injection (HCI) can be exploited to create a trojan that will cause hardware failures. The trojan is produced not via additional logic circuitry but by controlled scenarios that maximize and accelerate the HCI effect in transistors. These scenarios range from manipulating the manufacturing process to varying the internal voltage distribution. This new type of trojan is difficult to test due to its gradual hardware degradation mechanism. This paper describes the HCI effect, detection techniques and discusses the possibility for maliciously induced HCI trojans.

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Section: Hci Trojanmentioning

confidence: 99%