Characterization of common-mode choke for automotive ethernet networks enabling 100 Mbit/s

Mortazavi, Sanaz; Schleicher, Detlef; Gerfers, Friedel

doi:10.1109/emceurope.2017.8094720

Cited by 12 publications

(1 citation statement)

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“…The stray capacitance of CMCs may cause an instantaneous current at the moment the TLP pulse is applied [5]. However, according to the equivalent circuit model parameters supplied by device vendors and the construction result of an equivalent circuit model [6], the equivalent CMC stray capacitance is several pF or smaller, that is, the stray capacitance does not cause significant edge rounding. Incidentally, a rounding waveform caused by the stray capacitance is not seen in this experiment.…”

Section: Consideration For Triggeringmentioning

confidence: 99%

Influence of cable length between TLP test system and DUT and its correction for CMCESD saturation measurement

et al. 2023

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Focusing on the TLP (transmission line pulse) method used for ESD (electrostatic discharge) saturation measurement described in IEC 62228-5 Annex E, we investigated the validity of its measurement conditions. Since there is no provision for the cable length between a TLP test system and a device under test, we investigated the influence of the cable length on the ESD saturation measurement. The result shows that different voltage and current waveforms in the measurement time window, i.e., different I/V characteristics, can be obtained due to the cable propagation delay. This paper proposes a method to correct the influence of the cable length by using the rising edge of the reflected wave observed at the TLP test system as a trigger for the measurement time window.

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Section: Consideration For Triggeringmentioning

confidence: 99%