1991
DOI: 10.1063/1.104809
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Characterization of ion-implanted InxGa1−xAs/GaAs 0.25 μm gate metal semiconductor field-effect transistors with F t≳100 GHz

Abstract: This work presents millimeter wave performance achieved by ion-implanted InGaAs/GaAs metal semiconductor field-effect transistor devices. A current gain cutoff frequency ft of 126 GHz and maximum frequency of oscillation fmax of 232 GHz have been measured for 0.20 μm gate length devices. The ft and low-field Hall mobility data, measured at 300 and 112 K, lead us to conclude that the average electron velocity under the gate is mainly due to the high-field velocity rather than low-field electron mobility.

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Cited by 6 publications
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“…In recent years, it has been established that In x Ga 1Àx As is very useful for high-frequency and high-speed device applications 1) because of the large energy separation between À and Ł symmetry points. For low indium concentrations (x 0:18), a thick layer of In x Ga 1Àx As on a GaAs substrate improves Schottky gate barrier height, leading to a reduction in leakage current.…”
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confidence: 99%
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“…In recent years, it has been established that In x Ga 1Àx As is very useful for high-frequency and high-speed device applications 1) because of the large energy separation between À and Ł symmetry points. For low indium concentrations (x 0:18), a thick layer of In x Ga 1Àx As on a GaAs substrate improves Schottky gate barrier height, leading to a reduction in leakage current.…”
mentioning
confidence: 99%
“…For low indium concentrations (x 0:18), a thick layer of In x Ga 1Àx As on a GaAs substrate improves Schottky gate barrier height, leading to a reduction in leakage current. 1) The In x Ga 1Àx As alloy on a InP substrate for 0:30 x 0:70 is useful for photoconductive switches, 2) long-wave optical modulators. 3) Metallorganic molecular beam epitaxy (MOMBE) 4) is a widely accepted growth technique for successful synthesis of semiconducting alloys.…”
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confidence: 99%
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