2003
DOI: 10.1016/s0379-6779(02)01284-5
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Characterization of ITO/CuPc/AI and ITO/ZnPc/Al structures using optical and capacitance spectroscopy

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Cited by 46 publications
(36 citation statements)
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“…The experimental details are identical to those previously reported [5], except the thickness of the CuPc layers, 100 nm in the present work. The film thickness was confirmed by interference profilometry.…”
Section: Methodssupporting
confidence: 54%
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“…The experimental details are identical to those previously reported [5], except the thickness of the CuPc layers, 100 nm in the present work. The film thickness was confirmed by interference profilometry.…”
Section: Methodssupporting
confidence: 54%
“…Cross-checks between different electrical characterization methods are then needed, in order to select among the different possible interpretations of the experimental results. In this paper we extend to different temperatures our previously reported analysis on the correlation between dc current-voltage measurements and capacitance spectroscopy performed on ITO/CuPc/Al devices [5].…”
Section: Introductionmentioning
confidence: 55%
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“…As shown in the inset of Fig. 4.5, the difference in energy level between the work function of an ITO anode (∼4.4 eV) and the highest occupied molecular orbital of ZnPc (5.17 eV [51]) at the ITO/ZnPc:C 60 interface, can be reduced significantly after the ITO anode is modified with Ag nanoparticles/CF X . The reduced electronic barrier at the ITO/CF X -Ag nanoparticles /ZnPc:C 60 interface is favorable for charge extraction in OSCs.…”
Section: Effect Of Ito Surface Electronic Properties On Osc Performancementioning
confidence: 95%
“…The existence of these continuous energy trap states was mentioned with various energy density of states (DOS). The functional dependence can be for example exponential, single gaussian or multiple gaussian [2][3][4][5][6][7][8].…”
Section: Introductionmentioning
confidence: 99%