Characterization of the amplitude frequency response of analog-to-digital converters

Aguilar, Javier Diaz de; Salinas, J. R.; Lapuh, R.; Méndez, Alfredo; Lagos, Francisco García; Sanmamed, Yolanda A.

doi:10.1109/cpem.2016.7540455

Cited by 5 publications

(1 citation statement)

References 9 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The Spanish Metrology Centre (CEM) together with other NMIs have been working on this topic for some time: from the characterization of analog-to-digital converters (ADC) [3][4][5], to the description of quantum standards [6][7][8][9] and the combined use of ADC and quantum standards on the same measurement arrangement [10][11][12][13][14].…”

Section: Introductionmentioning

confidence: 99%

Feasibility of a digital counterpart of thermal-converter-based current step up

Peral¹,

Sanmamed²,

Aguilar³

2022

Proceedings of the 25th IMEKO TC4 International Symposium and 23rd International Workshop on ADC and DAC Modelling and Testing

View full text Add to dashboard Cite

The development of a new traceability stepup chain using digital instruments (digitisers) with direct traceability to SI would allow dynamic measurements of current and voltage waveforms. CEM has studied the feasibility of a digital counterpart for the traditional thermal-converter-based step up, which is limited to provide the RMS values of monotone signals. This paper describes and validates this new digital method, obtaining a complete set of calibrations shunt-digitizer for currents up to 1 A. The performed measurements show very promising results, comparable to the well-established thermal-converter approach results, with differences between both techniques lower than 2 μA/A up to 1 kHz.

show abstract