Charakterisierung von Plasma‐ Polymerfilmen mittels Flugzeit‐ Sekundärionen‐Massenspektrometrie (ToF‐SIMS). Characterisation Plasma‐Polymerfilms by Time‐of‐Flight Secondary Ion Mass Spectrometry (ToF‐SIMS)

Gradowski, M. von; Wahl, Michael; Jacoby, B.; Hilgers, H.; Kopnarski, Michael

doi:10.1002/vipr.200500248

Cited by 4 publications

(3 citation statements)

References 4 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Another example was reported by Gradowski et al who used multivariate analysis for modelling the complete information from ToF-SIMS spectra to correlate with wetting behaviour of plasma-polymer films. [3] Urquhart et al [4] have also reported the use of ToF-SIMS analysis to determine the relationship between water contact angle (WCA) and the surface chemistry of a polymer library array using partial least squares (PLS) regression. [5] A good correlation between ToF-SIMS data from the 576 acrylate-based polymers and contact angle was obtained.…”

Section: Introductionmentioning

confidence: 98%

Predicting the wettability of patterned ITO surface using ToF‐SIMS images

Shard

Lee

et al. 2010

Surface & Interface Analysis

View full text Add to dashboard Cite

Partial least squares (PLS) regression has been increasingly used as a tool for modelling linear relations between multivariate surface analytical measurements and measures of performance. However, the use of PLS to obtain quantitative predictions has only been partially explored. In this study, we construct a PLS model using time-of-flight secondary ion mass spectrometry (ToF-SIMS) and water contact angle (WCA) data obtained from a series of differently treated indium tin oxide (ITO) surfaces. This model displays a reasonable correlation between the WCA values and the SIMS data. To validate the model, ITO surfaces patterned with different areas of wettability were examined using ToF-SIMS imaging to produce WCA maps. The PLS model was applied to predict the spatial variation in WCA across the sample. The direct measurement of WCA on the patterned ITO surface was achieved using a small-scale interval grid from picolitre volume water droplets. We present the correlations between the predicted WCA from SIMS and the measured WCA, and highlight the discrepancies that arises in the comparison of the two datasets. This work is of direct benefit to industries where wettability is crucial but direct contact angle measurements are acquired on a scale smaller than it is possible to produce liquid drops, such as the plastic electronics and microfluidics industries.

show abstract

Section: Introductionmentioning

confidence: 98%

Predicting the wettability of patterned ITO surface using ToF‐SIMS images

Shard

Lee

et al. 2010

Surface & Interface Analysis

View full text Add to dashboard Cite

show abstract

“…For this purpose, samples of size 10 x 15 mm are prepared out of the liner and combined to a topring. The analysis of the boundary layer is carried out by using mass spectroscopic methods such as secondary ion mass spectroscopy (SIMS), which detects ablated particles according to their mass and charge from a surface by external ion bombardment, and thus can provide a depth-resolved composition of the solid body [13]. This analysis will explain the structure of a boundary layer as a result of mechanical and tribological load of the specimen to enable conclusions for an optimized finishing process.…”

Section: Methodsmentioning

confidence: 99%

Analogy Studies of the Effect of Finishing on the Tribological Running-In Behaviour of Engine Components Using the Example of the Cylinder Running Surface

Karpuschewski

Welzel

Risse

2014

AMR

View full text Add to dashboard Cite

A variety of current scientific work shows the importance and possibilities of an effective conditioning of tribological contacts to minimize friction and wear, respectively an increase in performance of tribological highly stressed components. By slight modifications of the finishing process positive effects like the increase of lifetime or increase of power can therefore be generated. Based on this approach the tribological system piston ring/cylinder running surface of internal combustion engines is an example with high potential for optimization of production. This paper introduces alternative production and conditioning processes. The evaluation of chemical modifications of boundary layers, which are used in addition to the topography as a representative indicator for the description of the functionalities of produced surfaces is considered to be a special aspect. The present paper combines considerations of manufacturing technology with tribological tests showing the relationships and dependencies between the process characteristics of finishing and the operational behavior of the examined components.

show abstract

“…A more recent trend is to use multivariate methods, principal component analysis (PCA) and partial least squares (PLS) modeling, in evaluation of ToF‐SIMS data sets and their correlation to other parameters as, e.g. CAs 14–16…”

Section: Introductionmentioning

confidence: 99%

Surface analytical characterization of micro‐fluidic devices hot embossed in polymer wafers: Surface chemistry and wettability

Baytekin

Wirth

Groß

et al. 2010

Surface & Interface Analysis

View full text Add to dashboard Cite

Recently, time-of-flight secondary ion mass spectrometry (ToF-SIMS) and X-ray photoelectron spectroscopy (XPS) instrumentation has been used to address areas of interest within micro-fluidic devices providing full access to the surface chemistry established at the bottom of micro-channels therein. After careful calibration, information on surface chemistry as obtained by ToF-SIMS or XPS can be interpreted in terms of wettability expressed as contact angles which are then characteristic for the inner walls of micro-channels. Standard contact angle measurement is not applicable in micro-channels. The approach has been demonstrated to be successful with two different micro-fluidic devices hot embossed into high-end quality poly(methyl methacrylate) (PMMA) or Polycarbonate wafers. A pre-selected surface chemistry at micro-channel walls can be established by plasma technologies but ageing and rinsing effects have to be under control. A combination of ToF-SIMS, XPS and contact angle measurement techniques has been demonstrated to provide the required information. Finally, it is shown by ToF-SIMS and XPS analysis that in the production of micro-fluidic parts during practical processing using hot embossing technologies, material originating from cover foils will reside on the polymer wafer's surface. Moreover, residues of releasing agents as silicone oil used during processing can be detected by ToF-SIMS. Both cover foil residues and silicones are issues of trouble shooting in micro-fluidics because they will change contact angles efficiently.

show abstract

Charakterisierung von Plasma‐ Polymerfilmen mittels Flugzeit‐ Sekundärionen‐Massenspektrometrie (ToF‐SIMS). Characterisation Plasma‐Polymerfilms by Time‐of‐Flight Secondary Ion Mass Spectrometry (ToF‐SIMS)

Cited by 4 publications

References 4 publications

Predicting the wettability of patterned ITO surface using ToF‐SIMS images

Predicting the wettability of patterned ITO surface using ToF‐SIMS images

Analogy Studies of the Effect of Finishing on the Tribological Running-In Behaviour of Engine Components Using the Example of the Cylinder Running Surface

Surface analytical characterization of micro‐fluidic devices hot embossed in polymer wafers: Surface chemistry and wettability

Contact Info

Product

Resources

About