2000
DOI: 10.1016/s0379-6779(99)00234-9
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Charge carrier mobilities in dark-conductive organic thin films determined by the surface acoustoelectric travelling wave (SAW) technique

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Cited by 13 publications
(3 citation statements)
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“…Recently, the carrier mobility of organic semiconductors has been measured by TOF, SCLC, FET characterizations, and Hall effect measurements . Early experimental methods to determine carrier mobilities by electric transport methods include the equilibrium charge carrier extraction method, drift current methods under limited range conditions, the conductivity/concentration (σ/ n ) method, the surface acoustic‐electric traveling wave method, etc . These methods have been less employed than FET characterizations, which directly connect the mobility value to the functional circuits.…”
Section: Ideal and Nonideal Ofetsmentioning
confidence: 99%
“…Recently, the carrier mobility of organic semiconductors has been measured by TOF, SCLC, FET characterizations, and Hall effect measurements . Early experimental methods to determine carrier mobilities by electric transport methods include the equilibrium charge carrier extraction method, drift current methods under limited range conditions, the conductivity/concentration (σ/ n ) method, the surface acoustic‐electric traveling wave method, etc . These methods have been less employed than FET characterizations, which directly connect the mobility value to the functional circuits.…”
Section: Ideal and Nonideal Ofetsmentioning
confidence: 99%
“…Charge carrier mobility is the key characteristic of organic semiconductors. Experimentally, it can be extracted from time-of-flight measurements 1,2 , currentvoltage characteristics in a diode 3,4 or field effect transistor 5,6 , pulse-radiolysis time-resolved microwave conductivity measurements 7 , or other techniques [8][9][10][11][12][13][14][15][16][17] .…”
Section: Introductionmentioning
confidence: 99%
“…[40][41][42] It has been used to characterize the drift mobility of semiconductors, 43 electromagnetic properties of two-dimensional electron system (2DES) on GaAs/Al x Ga 1-x As heterojunctions, 44,45 acoustoelectric currents in magnetic thin films, 46 superconducting properties of thin films, 47 and charge carrier mobility in organic thin films. 48 We have also reported several results obtained using this measurement method, for example, dielectric properties of C 60 and carbon nanotube films, 49,50 excitation states of antimony impurity in silicon, 51 ionization energies of nitrogen impurity in 4H-SiC crystal 52 in our previous works. By increasing coupling area of the sample with external electric field, we found that this method is very effective for characterizing ultra-thin sample.…”
Section: Introductionmentioning
confidence: 91%