2005
DOI: 10.1116/1.1924608
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Chemisorption of C60 on the Si(001)-2×1 surface at room temperature

Abstract: Articles you may be interested inInterfacial electronic structure of trimethyl-aluminum and water on an In0.20Ga0.80As(001)-4 × 2 surface: A highresolution core-level photoemission studySimulations of C 28 chemisorption on diamond (001)-(2×1) surface: The comparison between cluster-cluster interaction and cluster-surface interaction Cesium-induced structural transformation from the Si(113)3 ×2 to the 3×1 surface A synchrotron-radiation photoemission study of C 60 deposited on a clean Si͑001͒-2 ϫ 1 surface at r… Show more

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Cited by 18 publications
(26 citation statements)
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References 49 publications
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“…spectrum measured for the C 60 film with the HOMO, H F , located at $2.0 eV BE agrees well with the bulk fullerene spectrum. 8,9 Upon rubrene deposition, the HOMO of rubrene, H R , instantly appears as a small bulge at $1 eV BE. With increasing rubrene coverage, the rubrene-derived states increase in intensity at the expense of the C 60 -related states.…”
Section: Resultsmentioning
confidence: 99%
“…spectrum measured for the C 60 film with the HOMO, H F , located at $2.0 eV BE agrees well with the bulk fullerene spectrum. 8,9 Upon rubrene deposition, the HOMO of rubrene, H R , instantly appears as a small bulge at $1 eV BE. With increasing rubrene coverage, the rubrene-derived states increase in intensity at the expense of the C 60 -related states.…”
Section: Resultsmentioning
confidence: 99%
“…A 125-mm hemispherical analyzer ͑OMICRON Vakuumphysik GmbH͒ in an UHV chamber with base pressure less than 2.5ϫ 10 −11 Torr collected the photoelectrons. 27 Upon annealing the 0.5-ML C 60 film, peak A shifted to lower binding energy by 0.1 eV, but at 600°C it reverted to the original position. A mirror-polished Si͑001͒ single crystal ͑ =1 −10 ⍀ cm, P͒ of n type was preoxidized according to the method of Ishizaka and Shiraki, 26 and annealed in a stepwise manner to 875°C in the photoemission chamber to remove the protective oxide layers.…”
Section: Methodsmentioning
confidence: 95%
“…In Fig. 27,33 This fit is shown in Fig. A broad line, D, at binding energy 283.8 eV is attributed to carbon atoms that bond covalently with the silicon atoms on the surface, the C-Si bond.…”
Section: Methodsmentioning
confidence: 97%
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“…On the other hand, the PES [5,6] and STS [8,9] data of the C 60 /SiA C H T U N G T R E N N U N G (001) system showed that the surface states originating from Si dimers disappear near the Fermi level. For this, Sakamoto et al suggested that Si dimers participate in bonding to adsorbed C 60 , thereby resulting in the disappearance of surface states.…”
mentioning
confidence: 93%