2019 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD) 2019
DOI: 10.1109/ispsd.2019.8757635
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Circuit Dependent Plasma Charging Effect Robustness in 0.16 um BCD Technology Platform

Michele Basso
1
,
Damiano Riccardi
2
,
Antonino Martino
3
et al.
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