Clamping-induced changes of domain morphology in 88%Pb(Zn1/3Nb2/3)O3-12%PbTiO3

Chang, L.-W.; Valanoor, Nagarajan; Okatan, M. Baris; Gregg, J. M.

doi:10.1063/1.4891312

Cited by 2 publications

(1 citation statement)

References 27 publications

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“…The fact that both meso‐ and nanoscale imaging indicated very similar configurations suggests that singularities are both unlikely and unfavorable in complex quadrant domains in ferroelectrics. The same group studied PZN‐12PT lamella placed on their sidewalls on Pt‐coated MgO carriers . They found that the change in clamping between the lamella placed flat and those placed on their sidewalls caused a variation in domain configurations.…”

Section: Domain Engineering and Manipulation Via Fib Nanostructuringmentioning

confidence: 99%

Nanostructuring Ferroelectrics via Focused Ion Beam Methodologies

Burns

Gregg

Valanoor

2016

Adv Funct Materials

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As we reach the physical limit of Moore's law and silicon based electronics, alternative schemes for memory and sensor devices are being proposed on a regular basis. The properties of ferroelectric materials on the nanoscale is key to developing device applications of this intriguing material class, and has been readily pursued in recent times. One of the most significant techniques with which nanostructuring is achieved is the focused-ion-beam (FIB) microscope. Alongside nanoscale characterization obtained from piezoresponse force microscopy, the FIB has become a powerful tool in the search for first principles understanding of the ferroelectric phenomena. This review explores a brief history of the relationship between the FIB and ferroelectrics, the fascinating properties it has unveiled, and some alternative nanostructuring techniques.

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Section: Domain Engineering and Manipulation Via Fib Nanostructuringmentioning

confidence: 99%

Nanostructuring Ferroelectrics via Focused Ion Beam Methodologies

Burns

Gregg

Valanoor

2016

Adv Funct Materials

View full text Add to dashboard Cite

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Structural deformation of 0.74Pb(Mg1/3Nb2/3)O3-0.26PbTiO3 single crystal in 1–3 composites due to interface stresses and poling procedure optimization

Wang

Sun

Liu

et al. 2016

Journal of Applied Physics

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Interface stresses strongly influence the functional property of 1–3 piezoelectric composites. Using the translucent nature of (1 − x)Pb(Mg1/3Nb2/3)O3-xPbTiO3 single crystals, we have studied stress distributions and domain configuration changes during poling inside the crystal rods by polarizing light microscopy and piezoresponse force microscopy. It was found that the interface stresses due to interaction with polymeric filler led a deformed rhombohedral phase and caused incomplete poling near rod-edges. Compared with “hard” epoxy (Epotek301) filler, “soft” epoxy (Stycast) filler showed weaker impact on the crystals rods and less influence on domain configurations. We also show that high temperature poling (70 °C) can substantially improve the piezoelectric coefficient of composites filled with hard epoxy due to creeping above the glass transition Tg. Analytic stress distribution equations based on cylinder rods were modified to explain the physical principle and to predict the stress distribution for square rods case, which was verified by finite element simulation to be accurate within 5%.

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Clamping-induced changes of domain morphology in 88%Pb(Zn1/3Nb2/3)O3-12%PbTiO3

Cited by 2 publications

References 27 publications

Nanostructuring Ferroelectrics via Focused Ion Beam Methodologies

Nanostructuring Ferroelectrics via Focused Ion Beam Methodologies

Structural deformation of 0.74Pb(Mg1/3Nb2/3)O3-0.26PbTiO3 single crystal in 1–3 composites due to interface stresses and poling procedure optimization

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