Closing the gap between analog and digital testing

Automated Selection of Test Frequencies for Fault Diagnosis in Analog Electronic Circuits

“…Due to the limited number of data a proper cross-validation technique cannot be adopted in the sense that the performance estimate may not be enough accurate. A leave one out (LOO) validation technique has been considered which estimates the performance of the ensemble of classifiers receiving the candidate test frequency set (a 95% of confidence has been considered, see [6]). …”

“…The interesting related effect is that the frequencies it receives are the most relevant ones to solve the envisioned application and the obtained classifier is the one to be used also to solve the diagnosis problem. The final algorithm implementing the test frequency selection can be summarized as follows: 6. Set comprises the optimal set of test frequency and the associated classifier is the optimal diagnosis classifier.…”

“…In [6], fault observabilty is reached by taking into account also fault masking while [5] addresses test sine waveforms selection by minimizing the risk of false rejection and false acceptance of a CUT. A different approach has been suggested in [4] where test waveforms to be considered have spectra maximizing a testability function in the frequency domain.…”

Built-in Loopback Test for IC RF Transceivers

“…Since the "worst-case" analysis provides over-pessimistic estimates while the Monte Carlo technique tends to suffer from excessive simulation effort, one can refer to behavioral models. The problem can be discussed using a simple statistical model and the sensitivity analysis [16], [24].…”

Wavelet Transform in Fault Diagnosis of Analogue Electronic Circuits

“…Growing complexity of analogue and mixed-level electronic systems (e.g. system-on-chip -SoC) still rises the bar for testing methods (Baker et al, 1996;Balivada et al, 1996;Chruszczyk et al 2006Chruszczyk et al , 2007, 2009, 2011Chruszczyk 2011;Dali & Souders 1989;Kilic & Zwolinski, 1999;Milne et al, 1997;Milor & Sangiovanni-Vincentelli, 1994;Pecenka et al, 2008;Saab et al 2001;Savir & Guo, 2003;Somayajula et al, 1996).…”