Combining scanning probe microscopy and x-ray spectroscopy

Abstract

A new versatile tool, combining Shear Force Microscopy and X-Ray Spectroscopy was designed and constructed to obtain simultaneously surface topography and chemical mapping. Using a sharp optical fiber as microscope probe, it is possible to collect locally the visible luminescence of the sample. Results of tests on ZnO and on ZnWO4 thin layers are in perfect agreement with that obtained with other conventional techniques. Twin images obtained by simultaneous acquisition in near field of surface topography and of local visible light emitted by the sample under X-Ray irradiation in synchrotron environment are shown. Replacing the optical fibre by an X-ray capillary, it is possible to collect local X-ray fluorescence of the sample. Preliminary results on Co-Ti sample analysis are presented.

Spatial resolution of confocal XRF technique using capillary optics

“…Of course, working with a synchrotron source would lead to higher signal magnitude which could allow to further shrink the capillary radius, and a sub-100-nm lateral resolution could probably be reached. The short capillary-sample working distance suggests that the cylindrical capillary could act as a scanning probe microscope tip to acquire simultaneously sample topography and chemical mapping by XRF analysis [23], as already demonstrated for simultaneous SNOM-XAS XEOL [17] apparatus. Moreover, within this perspective, the spatial resolution of the detection would not be limited by the critical angle θ c because the extremity of the glass tube would be approached in mechanical near-field interaction with the sample.…”

“…An X-ray beam provided by a low power Rh source operating at 35 kV and 800 μA is focused on a sample using a 6-mm focal distance polycapillary lens [16,17]. The beam incidence angle is 30°.…”

Confocal X-ray technology based on capillary X-ray optics

“…The order of magnitude of the gain in power density in the output focal spot of the PHFXRL could be up to 10 4 if the PHFXRL is used fully. Therefore, the PHFXRL is used widely to focus the synchrotron radiation for micro-X-ray analysis (Sun et al 2006, Fauquet et al 2011). The PFXRL can focus a divergent X-ray beam into a micro-output focal spot.…”

Versatile atomic force microscopy setup combined with micro-focused X-ray beam

“…Multiple approaches have been developed for simultaneous analysis of nanostructures using Scanning Probe Microscopy (SPM) and X-ray methods. SPM techniques such as Atomic Force Microscopy (AFM) and scanning tunneling microscopy (STM) have already been combined with the micro-focused X-ray beams [1][2][3][4][5][6][7][8][9] . It has been shown that morphology and material sensitivity of the scanning methods combined with versatility of X-ray methods opens new opportunities for dedicated research of nanoworld.…”