Comment on “Near-Edge X-Ray Absorption Fine-Structure Investigation of Graphene”

Jeong, Hae Kyung; Noh, Han-Jin; Kim, J.-Y.; Colakerol, L.; Glans, Per‐Anders; Jin, Meihua; Smith, K. E.; Lee, Y. H.

doi:10.1103/physrevlett.102.099701

Cited by 57 publications

(34 citation statements)

References 6 publications

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“…Figure 4a also suggests that the putative 'interlayer state' ascribed by Pacilé et al, as the intermediate between the π*and the σ*bands, is not an intrinsic feature of SLG [17][18][19] . To arrive at a better understanding of the origin of these features, we have annealed graphene samples in situ.…”

Section: Stxm Mapping Of the Electronic Structure Of Graphenementioning

confidence: 74%

“…This is contrary to the more common application of the XCH approximation to bound excitons in the X-ray excitations of molecules and molecular condensed phases 14,22,23 . The assignment of the area denoted as interlayer states and the distinctive pre-edge features noted for some of the domains in Figures 1c and 2b have been the topic of much recent contention for single-layered graphene (SLG) [16][17][18][19] . The latter resonance has been ascribed to a peculiarity in the band structure of singlelayered graphene.…”

Section: Stxm Mapping Of the Electronic Structure Of Graphenementioning

confidence: 99%

“…Here we present the direct experimental mapping (with ~40 nm spatial resolution) of discrete electronic domains within a single graphene sheet, and further use DFT calculations to elucidate the electronic structure of graphene in unprecedented detail; thus resolving several controversies that have recently emerged regarding the assignment of features in the X-ray absorption fine structure spectra of graphene [17][18][19] . Figures 1a and 2a show integrated C K-edge (280-320 eV) STXM images of two distinct single-layered graphene samples, wherein distinctive regions with apparently different optical densities have been demarcated.…”

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Imaging local electronic corrugations and doped regions in graphene

et al. 2011

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Electronic structure heterogeneities are ubiquitous in two-dimensional graphene and profoundly impact the transport properties of this material. Here we show the mapping of discrete electronic domains within a single graphene sheet using scanning transmission X-ray microscopy in conjunction with ab initio density functional theory calculations. scanning transmission X-ray microscopy imaging provides a wealth of detail regarding the extent to which the unoccupied levels of graphene are modified by corrugation, doping and adventitious impurities, as a result of synthesis and processing. Local electronic corrugations, visualized as distortions of the π*cloud, have been imaged alongside inhomogeneously doped regions characterized by distinctive spectral signatures of altered unoccupied density of states. The combination of density functional theory calculations, scanning transmission X-ray microscopy imaging, and in situ near-edge X-ray absorption fine structure spectroscopy experiments also provide resolution of a longstanding debate in the literature regarding the spectral assignments of pre-edge and interlayer states.

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Section: Stxm Mapping Of the Electronic Structure Of Graphenementioning

confidence: 74%

Section: Stxm Mapping Of the Electronic Structure Of Graphenementioning

confidence: 99%

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Imaging local electronic corrugations and doped regions in graphene

et al. 2011

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“…The origin of peak K has been contentious, and alternative descriptions ascribe it to residual functionalization [39,40], especially the bonding between carbon and oxygen, or a free-electron-like interlayer-state [25,41]. In our SCF-FP result of XANES of the graphene cluster of radius 30Å, for out-of-plane polarization (α=74 • , Fig.…”

Section: Xanes Of Graphenementioning

confidence: 99%

X-ray absorption spectra of graphene and graphene oxide by full-potential multiple scattering calculations with self-consistent charge density

Krüger

Natoli

et al. 2015

Phys. Rev. B

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X-ray absorption near edge structure (XANES) of graphene, graphene oxide and diamond are studied by the recently developed real-space full potential multiple scattering (FPMS) theory with space-filling cells. It is shown how accurate potentials for FPMS can be generated from self-consistent charge densities obtained with other schemes, especially the projector augmented wave method. Compared to standard multiple scattering calculations in the muffin-tin approximation, FPMS gives much better agreement with experiment. The effects of various structural modifications on the graphene spectra are well reproduced. (1) Stacking of graphene layers increases the peak intensity in the higher energy region. (2) The spectrum of the C atom located at the edge of graphene sheet shows a prominent pre-edge structure. (3) Adsorption of oxygen gives rise to the so-called interlayer-state peak. Moreover, O K-edge spectra of graphene oxide are calculated for three types of bonding, C-OH, C-O-C and C-O, and the proportions of these bondings at 800 • C are deduced by fitting them to the experimental spectrum.

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“…One of these studies identified spectral features reflecting the properties of the unoccupied states of a single layer [63]. A splitting of the π * resonance in FLG was ascribed to interlayer states, but these results were later questioned [64]. Recently, the dark-field (df) PEEM method has been demonstrated, [23,65] paving the way to laterally-resolved measurements of the local density of states of the π band.…”

Section: Graphenementioning

confidence: 97%

Chemical and Magnetic Imaging with X-Ray Photoemission Electron Microscopy

Locatelli

Menteş

2014

Synchrotron Radiation

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X-ray photoemission electron microscopy (XPEEM) is a full-field imaging technique giving access to the chemical state and magnetic order of laterally inhomogeneous surfaces, interfaces and thin films. In its simplest variant, synchrotronbased PEEM uses secondary emission to map local differences in the oxidation state, valence, and bond orientation around the emitter. The combination with X-ray circular and linear dichroism techniques represents the most frequent application, and has found extensive use in imaging ferromagnetic and antiferromagnetic domains. XPEEM instruments with energy filter can implement laterally resolved X-ray photoelectron spectroscopy (XPS) and angle resolved photoelectron spectroscopy (ARPES), reaching high chemical and electronic structure sensitivity. Here, we describe the basic aspects and methods of synchrotron-based spectromicroscopy with the PEEM, and its combination with low energy electron microscopy (LEEM). The present state of the art of the technique will be illustrated by applications in diverse fields, spanning from surface and materials sciences to biology and magnetism.

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Comment on “Near-Edge X-Ray Absorption Fine-Structure Investigation of Graphene”

Abstract: A Comment on the Letter by D. Pacilé et al., Phys. Rev. Lett. 101, 066806 (2008)10.1103/PhysRevLett.101.066806. The authors of the Letter offer a Reply.

Cited by 57 publications

References 6 publications

Imaging local electronic corrugations and doped regions in graphene

Imaging local electronic corrugations and doped regions in graphene

X-ray absorption spectra of graphene and graphene oxide by full-potential multiple scattering calculations with self-consistent charge density

Chemical and Magnetic Imaging with X-Ray Photoemission Electron Microscopy

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