2013
DOI: 10.1364/oe.21.018872
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Common-path laser planar encoder

Abstract: This paper presents a common-path laser planar encoder (CLPE) for displacement measurements in the X- and Y- axes. The CLPE can effectively reduce the environmental disturbance to its lowest level. The experimental results of the CLPE match well with those of HP5529A for both short and long ranges. The CLPE can measure 2D displacement with high resolutions of 0.07 ± 0.021 nm and 0.07 ± 0.023 nm in the X- and Y- axes and also presents high system stabilities of -0.59 ± 0.43 nm/h and -0.63 ± 0.47 nm/h respective… Show more

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Cited by 18 publications
(6 citation statements)
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“…The above experimental results show that the proposed surface encoder can measure not only in-plane displacement, but also out-of-plane displacement compared with planar encoders [ 23 , 24 , 25 ]. Additionally, it expanded its measuring range in out-of-plane direction ( Z -axis direction) from hundreds of micrometers to ±1.5 mm compared with conventional surface encoders [ 26 , 27 , 28 ] while reducing the optical size [ 33 , 34 ].…”
Section: Testing Of the Modified Two-axis Surface Encodermentioning
confidence: 89%
See 1 more Smart Citation
“…The above experimental results show that the proposed surface encoder can measure not only in-plane displacement, but also out-of-plane displacement compared with planar encoders [ 23 , 24 , 25 ]. Additionally, it expanded its measuring range in out-of-plane direction ( Z -axis direction) from hundreds of micrometers to ±1.5 mm compared with conventional surface encoders [ 26 , 27 , 28 ] while reducing the optical size [ 33 , 34 ].…”
Section: Testing Of the Modified Two-axis Surface Encodermentioning
confidence: 89%
“…Planar encoders have been proposed to detect two-axis in-plane displacements [ 23 , 24 , 25 ]. To also detect the out-of-plane displacement, the authors’ group have been working on the development of a three-axis displacement sensor referred to as the surface encoder [ 26 , 27 , 28 ].…”
Section: Introductionmentioning
confidence: 99%
“…typically require multiple sensing heads or optical access ports. In addition, various designs using gratings to achieve multi-dimensional displacement measurements have been conceived [22,23,24,25,26,27,28].…”
Section: Introductionmentioning
confidence: 99%
“…Although it is difficult to assure high accuracy because there are some critical issues such as a periodic error, a distortion error, and a thermal error, optical linear encoders are often employed in precision positioning systems in machine tools and measuring instruments due to their high resolutions and easy-to-use designs. Many efforts have been made so far to improve the resolution of optical linear encoders [28,32,33,34,35,36,37,38,39,40,41,42], and nowadays state-of-the-art optical linear encoders can realize a sub-nanometer resolution comparable to that of the laser interferometers [4,6,7]. Furthermore, absolute linear encoders enable machine tools, measuring instruments and fabrication equipment to be operated without the initialization of their positioning systems [43], which is mandatory when the incremental laser interferometers and/or linear encoders are employed.…”
Section: Introductionmentioning
confidence: 99%