2006
DOI: 10.1016/j.apsusc.2006.03.060
|View full text |Cite
|
Sign up to set email alerts
|

Comparative study of the GaAs(100) surface cleaned by atomic hydrogen

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

0
16
0

Year Published

2008
2008
2017
2017

Publication Types

Select...
6

Relationship

1
5

Authors

Journals

citations
Cited by 17 publications
(16 citation statements)
references
References 48 publications
0
16
0
Order By: Relevance
“…However, even if it is clear that hydrocarbons are the reaction products, there is no clear evidence for the specific form of the hydrocarbon [8,14,39]. Thus, in order to identify the reaction products upon the atomic hydrogen irradiation we have performed mass spectrometry during the treatment of the EPI sample.…”
Section: Resultsmentioning
confidence: 98%
See 1 more Smart Citation
“…However, even if it is clear that hydrocarbons are the reaction products, there is no clear evidence for the specific form of the hydrocarbon [8,14,39]. Thus, in order to identify the reaction products upon the atomic hydrogen irradiation we have performed mass spectrometry during the treatment of the EPI sample.…”
Section: Resultsmentioning
confidence: 98%
“…GaAs(1 0 0) surface [14] by applying mass spectrometry (MS), Auger electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS). Using this set of surface analysis methods, it was possible for the first time to show directly that one of the major reaction products is methane.…”
mentioning
confidence: 99%
“…On patterned substrates, therefore, the oxide is normally removed by exposure to a hydrogen atom flux, which allows the oxide to be removed at lower temperatures, $400 1C, without surface pitting occurring, due to the reaction Ga 2 O 3 +4H-Ga 2 O+2H 2 O [10]. However, this method is known to lead to Fermi-level surface pinning and possible degradation of the surface if the hydrogen dose is not carefully controlled [11,12], and care must be taken to avoid surface contamination being introduced during the hydrogenation [13].…”
Section: Introductionmentioning
confidence: 99%
“…H assisted oxide removal has proved a powerful alternative clean-up technique [11], unfortunately a H source is not usually available on III-V MBE systems. Other works have utilised a precise thickness of sacrificial GaAs capping layers grown directly onto the oxide [12], which has been shown to be a viable technique for protecting highly thermally stable AlGaAs structures [13][14][15].…”
Section: Introductionmentioning
confidence: 99%