2021
DOI: 10.1109/ted.2021.3058091
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Comparative Study of the Photoelectric and Thermal Performance Between Traditional and Chip-Scale Packaged White LED

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Cited by 12 publications
(5 citation statements)
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“…In contrast, excellent light output efficiency is conducive to reducing the temperature of the device and lengthening its lifetime [17]. Based on theory, experiment and simulation, the performance of PCT‐LED and EMC‐LED devices are studied [18]. The study methods include comparing photoelectric parameters under different temperatures and driving currents such as optical power and luminous flux, analysing the thermal resistance structure and junction temperature under different experimental conditions, and verifying the junction temperature obtained from theoretical calculation and simulation.…”
Section: Methodsmentioning
confidence: 99%
“…In contrast, excellent light output efficiency is conducive to reducing the temperature of the device and lengthening its lifetime [17]. Based on theory, experiment and simulation, the performance of PCT‐LED and EMC‐LED devices are studied [18]. The study methods include comparing photoelectric parameters under different temperatures and driving currents such as optical power and luminous flux, analysing the thermal resistance structure and junction temperature under different experimental conditions, and verifying the junction temperature obtained from theoretical calculation and simulation.…”
Section: Methodsmentioning
confidence: 99%
“…(2) The higher temperature of the GaN chip and phosphors due to the higher current, will further result in variations in spectral structure. For the GaN chip, rising temperature can cause not only a decrease in optical power of the initial blue spectrum, but also a red shift of the peak wavelength that finally leads to a lower match with the excitation spectrum of YAG:Ce 3+ phosphors [32]. For YAG:Ce 3+ phosphors in the coating layer, the energy difference between the ground state 4 f and excited state 5d generally reduces with rising temperature, which will contribute to degradation in conversion efficiency [33].…”
Section: Photo-electro-thermal Properties Of Cafmentioning
confidence: 99%
“…The emergence of the board-level thermal dissipation pads and hybrid substrates brings about another issue on reliability are discussed in paper [7]. That is, the crack failure caused by thermal stress of different materials due to Coefficient of Thermal Expansion (CTE) mismatch under high temperature environment in paper [8].…”
Section: Challenges Of Board-level Thermal Dissipation and Reliabilit...mentioning
confidence: 99%