Comparison of intensity and absolute contrast of simulated and experimental high-resolution transmission electron microscopy images for different multislice simulation methods

Krause, Florian; Müller, Knut; Zillmann, Dennis; Jansen, J.C.; Schowalter, Marco; Rosenauer, A.

doi:10.1016/j.ultramic.2013.05.015

Cited by 24 publications

(11 citation statements)

References 21 publications

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“…The influence of the recording system is accounted for by applying the modulation-transfer function (MTF) to the Fourier transformed diffraction pattern. For the simulations in this paper we used the MTF of a Gatan UltraScan 2000 CCD camera [27].…”

Section: Simulation Detailsmentioning

confidence: 99%

“…The modulation-transfer function (MTF) of the image-recording system influences the contrast of recorded images [27]. For measurements of strain with the SANBED method the contrast of the diffraction images is not evaluated, but nevertheless the MTF is expected to affect the measurement as sharp edges of the diffraction discs are blurred.…”

Section: Influence Of the Modulation-transfer Function Of The Image-rmentioning

confidence: 99%

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Theoretical study of precision and accuracy of strain analysis by nano-beam electron diffraction

et al. 2015

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Section: Simulation Detailsmentioning

confidence: 99%

Section: Influence Of the Modulation-transfer Function Of The Image-rmentioning

confidence: 99%

Theoretical study of precision and accuracy of strain analysis by nano-beam electron diffraction

et al. 2015

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“…Meyer et al (2011) obtained good agreement with aberrationcorrected BF-CTEM imaging of graphene when the detector MTF and charge redistribution around defects were included. Krause et al (2013) obtained remarkably good agreement between aberration-corrected CTEM images and multislice calculations for small objective apertures and careful measurements including the detector MTF, and small deviations (1.2Â) for larger apertures (most likely due to the difficulty of measuring the aberrations accurately enough to match the rapidly oscillating portion of the transfer function). Imaging in the ADF-STEM has been quantitatively tested by LeBeau et al ( , 2009 Koch & Zuo (2000) have compared the results of various multislice and Bloch wave programs and found good agreement.…”

Section: Accuracymentioning

confidence: 64%

Computation in electron microscopy

Kirkland

2016

Acta Crystallogr A Found Adv

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Some uses of the computer and computation in high-resolution transmission electron microscopy are reviewed. The theory of image calculation using Bloch wave and multislice methods with and without aberration correction is reviewed and some applications are discussed. The inverse problem of reconstructing the specimen structure from an experimentally measured electron microscope image is discussed. Some future directions of software development are given.

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“…The MFP is chosen according to the width of the energy slit. The characteristics of the cameras are included by means of the modulation transfer functions (MTF), which were determined with a modified knife-edge method 45,46 . Further details are given in the methods section, the results are displayed in Fig.…”

Section: Angular Dependencies Of Elastic and Inelastic Scatteringmentioning

confidence: 99%

Influence of plasmon excitations on atomic-resolution quantitative 4D scanning transmission electron microscopy

Beyer

Krause

Robert

et al. 2020

Sci Rep

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Scanning transmission electron microscopy (STEM) allows to gain quantitative information on the atomic-scale structure and composition of materials, satisfying one of todays major needs in the development of novel nanoscale devices. The aim of this study is to quantify the impact of inelastic, i.e. plasmon excitations (PE), on the angular dependence of STEM intensities and answer the question whether these excitations are responsible for a drastic mismatch between experiments and contemporary image simulations observed at scattering angles below $$\sim $$ ∼ 40 mrad. For the two materials silicon and platinum, the angular dependencies of elastic and inelastic scattering are investigated. We utilize energy filtering in two complementary microscopes, which are representative for the systems used for quantitative STEM, to form position-averaged diffraction patterns as well as atomically resolved 4D STEM data sets for different energy ranges. The resulting five-dimensional data are used to elucidate the distinct features in real and momentum space for different energy losses. We find different angular distributions for the elastic and inelastic scattering, resulting in an increased low-angle intensity ($$\sim $$ ∼ 10–40 mrad). The ratio of inelastic/elastic scattering increases with rising sample thickness, while the general shape of the angular dependency is maintained. Moreover, the ratio increases with the distance to an atomic column in the low-angle regime. Since PE are usually neglected in image simulations, consequently the experimental intensity is underestimated at these angles, which especially affects bright field or low-angle annular dark field imaging. The high-angle regime, however, is unaffected. In addition, we find negligible impact of inelastic scattering on first-moment imaging in momentum-resolved STEM, which is important for STEM techniques to measure internal electric fields in functional nanostructures. To resolve the discrepancies between experiment and simulation, we present an adopted simulation scheme including PE. This study highlights the necessity to take into account PE to achieve quantitative agreement between simulation and experiment. Besides solving the fundamental question of missing physics in established simulations, this finally allows for the quantitative evaluation of low-angle scattering, which contains valuable information about the material investigated.

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Comparison of intensity and absolute contrast of simulated and experimental high-resolution transmission electron microscopy images for different multislice simulation methods

Cited by 24 publications

References 21 publications

Theoretical study of precision and accuracy of strain analysis by nano-beam electron diffraction

Theoretical study of precision and accuracy of strain analysis by nano-beam electron diffraction

Computation in electron microscopy

Influence of plasmon excitations on atomic-resolution quantitative 4D scanning transmission electron microscopy

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