2016
DOI: 10.1107/s205327331501757x
|View full text |Cite
|
Sign up to set email alerts
|

Computation in electron microscopy

Abstract: Some uses of the computer and computation in high-resolution transmission electron microscopy are reviewed. The theory of image calculation using Bloch wave and multislice methods with and without aberration correction is reviewed and some applications are discussed. The inverse problem of reconstructing the specimen structure from an experimentally measured electron microscope image is discussed. Some future directions of software development are given.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

0
25
0

Year Published

2016
2016
2022
2022

Publication Types

Select...
5
5

Relationship

0
10

Authors

Journals

citations
Cited by 34 publications
(25 citation statements)
references
References 243 publications
(249 reference statements)
0
25
0
Order By: Relevance
“…To understand the depth dependence of the plane-view images, multiple-scattering calculations of electron beam propagation through the model skyrmion bubble (Fig. 2) were performed using the multislice method 25 to produce the simulated ADF ( Fig. 3f) and p (Fig.…”
Section: ∫ ∫mentioning
confidence: 99%
“…To understand the depth dependence of the plane-view images, multiple-scattering calculations of electron beam propagation through the model skyrmion bubble (Fig. 2) were performed using the multislice method 25 to produce the simulated ADF ( Fig. 3f) and p (Fig.…”
Section: ∫ ∫mentioning
confidence: 99%
“…Many STEM studies such as high precision 2D measurements [26][27][28], 3D atomic electron tomography [29,30], and others [31], make use of image simulations of many thousands of STEM probe positions. This requires long computation times, even with modern implementations of the multislice method [25,[32][33][34][35][36][37]. It is therefore desirable to develop an electron scattering simulation algorithm that shares the calculation burden between STEM probe positions in a more efficient manner than multislice simulation.…”
Section: Introductionmentioning
confidence: 99%
“…The simplest is the convolution method, an incoherent linear image model that convolves the probe point-spread function with simple atomic potentials for the specimen [14]. This method assumes that there is no dynamic scattering and no interference between scattered and unscattered electrons [15]. Although the convolution method allows images to be computed very quickly, it is only accurate for very thin samples, and so has seen limited use.…”
Section: Introductionmentioning
confidence: 99%