Abstract:On-wafer characterization of MMIC’s performed by optoelectronic techniques such as photoconductive sampling or electro-optic sampling is currently investigated by several groups1. For photoconductive sampling, pulse generation and/or waveform sampling are done by illuminating a photoconductive gap with short laser pulses. In order to integrate monolithically the photoconductive gaps and the device under test, the gaps have to be fabricated with a technology compatible with GaAs MMIC’s fabrication technology. I… Show more
The sections in this article are
Characteristics of Photoconductive Switches
Types of Photoconductive Switches
Switch Materials and Their Characteristics
Theoretical Considerations
Photoconductive Switch Systems
The sections in this article are
Characteristics of Photoconductive Switches
Types of Photoconductive Switches
Switch Materials and Their Characteristics
Theoretical Considerations
Photoconductive Switch Systems
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