The chalcopyrite semiconductor CuGaSe 2 exhibits a bandgap energy (E G ) of 1.6-1.7 eV [1][2][3] and is thus a promising absorber material for top solar cells in two-junction tandem devices. [4,5] However, the bulk quality of CuGaSe 2 is comparatively poor, [6,7] with a low electron lifetime resulting from a high Shockley-Read-Hall (SRH) recombination rate. Different origins, such as energetically deep defects (e.g., via Ga Cu ), a high density of defects, and/or detrimental, Cu-rich grain boundaries, are discussed. [8][9][10][11][12][13][14][15][16] In addition to losses directly related to the CuGaSe 2 layer itself, front interface recombination is supposed to be pronounced when a standard CdS buffer is used. This is due to a negative conduction band offset (CBO) at the CdS/CuGaSe 2 interface (ΔE C %À0.35 eV), leading to a very minor (or absent) type inversion and a high recombination rate at the interface. [17][18][19] The highest efficiencies of CuGaSe 2 solar cells reported so far are 11.9% for a sample with a (Zn 1Ày ,Sn y )O z (ZTO) buffer layer (our lab, noncertified) [2] and 11.0% with a standard CdS buffer layer (certified). [20] The corresponding photovoltaic parameters are open-circuit voltages (V OC ) of 1.017 and 0.901 V, short-circuit current densities ( J SC ) of 17.5 and 17.1 mA cm À2 , and fill factors (FF) of 67.0 and 71.3%, respectively. Obviously, the main improvement when exchanging CdS by an alternative ZTO buffer layer is the higher V OC , resulting from a reduced (or canceled out) interface recombination, as a negative CBO can be avoided when using ZTO. [21,22] It has to be mentioned that in order to use these wide-gap devices in a tandem configuration, a transparent back contact (TBC) needs to be incorporated. So far, the highest efficiencies of CuGaSe 2 solar cells on TBCs are much lower, at about 5%. [23][24][25][26] Recently, research on the topic of TBCs has intensified and significant progress was observed, lifting the efficiency (η) of chalcopyrite solar cells with TBCs close to the level of those with standard Mo back contacts. [27][28][29][30][31][32][33] Thus, further improvements may be expected in the near future.The best V OC values for CdS-buffered samples are achieved after a postannealing at 200 °C, reaching 971 mV for a polycrystalline [34] and 946 mV for a single-crystal absorber. [35] However, usually the postannealing results in a decrease in FF and the best V OC values for a sample without postannealing are about 920 mV [20,36] or 960 mV when a Cu-deficient surface layer was deliberately introduced and the CdS thickness increased. [37] In our lab, running a three-stage deposition process at a maximum temperature of 550 °C, the reported V OC values for CuGaSe 2 cells with CdS buffer layers are typically in the range of 730-830 mV. [2,38,39] Differences in device parameters between research groups are explainable by details in the sample processing, such as the temperature, [2] metal evaporation profiles, [40] and Se flux [20] during absorber deposition, variations in t...