1991
DOI: 10.1016/0022-0248(91)90709-e
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Comparison of thin films ofYBa2Cu3O7−x deposited by physical (laser ablation) and chemical (OMCVD) methods for device applications

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Cited by 20 publications
(6 citation statements)
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“…Figure 4c shows that the FWHM of Co 3 0 4 (400) reflection of the film as deposited is 0.330. This compares well with FWHM of 0.28' of the (005) reflection of YBa 2 Cu307-5 films grown on SrTiO 3 (001) by MOCVD at 850'C [10]. To examine whether epitaxy is improved by annealing, the Co 3 0 4 films on LaA10 3 and SrTiO 3 were annealed for 60 min at 725°C in flowing oxygen.…”
Section: Resultsmentioning
confidence: 83%
“…Figure 4c shows that the FWHM of Co 3 0 4 (400) reflection of the film as deposited is 0.330. This compares well with FWHM of 0.28' of the (005) reflection of YBa 2 Cu307-5 films grown on SrTiO 3 (001) by MOCVD at 850'C [10]. To examine whether epitaxy is improved by annealing, the Co 3 0 4 films on LaA10 3 and SrTiO 3 were annealed for 60 min at 725°C in flowing oxygen.…”
Section: Resultsmentioning
confidence: 83%
“…Unfortunately, this method will result in a significant reduction of the sputtering rate. The second possibility, which has been the most widely used since the discovery of the HTS, is to work in the commonly used gas pressure region (10)(11)(12)(13)(14)(15)(16)(17)(18)(19)(20) and to avoid substrate bombardment by proper choice of the position of the substrates. More strictly speaking, the substrate position is optimum at locations where the ratio of bombardment rate and deposition is minimized.…”
Section: Sputter Deposition Techniquementioning
confidence: 99%
“…5,[11][12][13] And in this case, a simple planar heater with uniform temperature distribution is good enough. But the overheating of the first side during the second side deposition may cause the quality of the film to deteriorate, so simultaneous deposition is preferable in order to maintain side-to-side equality.…”
Section: Introductionmentioning
confidence: 97%
“…Moreover, differential thermal dilatation across the substrate-film interface results in the appearance of a tensionrelated misfit leading to the appearance of cracks under thermal cycling. Schieber et al [3] have shown the different lattice constants of substrates and YBCO thin films.…”
Section: Introductionmentioning
confidence: 99%