71st Device Research Conference 2013
DOI: 10.1109/drc.2013.6633885
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Complete band alignment determination of InAs-GaSb broken-gap tunneling field-effect transistor hetero-junction

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Cited by 2 publications
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“…54,55 The broken bandgap reduces the tunneling barrier, which results in a large tunneling probability ( P TB ). 56–58 The tunneling probability was obtained as, 59 in which m e is the electron effective mass, ħ represents the reduced Planck constant, and Φ TB and ω TB describe the height and width of the tunneling barrier, respectively. For the SiC/Ti 2 CO 2 heterojunction, the Φ TB and ω TB are 5.51 eV and 0.97 Å, respectively.…”
Section: Results and Analysismentioning
confidence: 99%
See 1 more Smart Citation
“…54,55 The broken bandgap reduces the tunneling barrier, which results in a large tunneling probability ( P TB ). 56–58 The tunneling probability was obtained as, 59 in which m e is the electron effective mass, ħ represents the reduced Planck constant, and Φ TB and ω TB describe the height and width of the tunneling barrier, respectively. For the SiC/Ti 2 CO 2 heterojunction, the Φ TB and ω TB are 5.51 eV and 0.97 Å, respectively.…”
Section: Results and Analysismentioning
confidence: 99%
“…54,55 The broken bandgap reduces the tunneling barrier, which results in a large tunneling probability (P TB ). [56][57][58] The tunneling probability was obtained as, 59 P…”
Section: Formation Mechanism Of Type-iii Heterojunctionsmentioning
confidence: 99%
“…Nevertheless, within the limits of the model used, the trap response time expected for this high-j gate stack on GaSb should be faster than 1ls, since traps beyond x ¼ 0.4 nm do not contribute to the overall D it . Figure 5 22 Reduction in I ON at T ¼ 150 K is attributed to increase in band-gap with decreasing temperature and thereby, increasing the barrier for tunneling from the conduction band in the source to valence band in the channel. I OFF in hetJ pTFET is 1 lA/lm, which is much higher than I OFF ¼ 3 nA/lm in GaSb homJ pTFET.…”
Section: Optimisation and Characterisation Of High-j/gasb Interfacementioning
confidence: 99%