2007
DOI: 10.1109/tasc.2007.899443
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Composition Profiles and Upper Critical Field Measurement of Internal-Sn and Tube-Type Conductors

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Cited by 11 publications
(14 citation statements)
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“…First fine grain Nb 3 Sn growth occurs in the presence of a Nb 6 Sn 5 layer. At 675 °C it needs typically 8 h to transform Nb 6 Sn 5 entirely into coarse grain (Nb-Ta) 3 Sn and subsequently only fine grain (Nb-Ta) 3 Sn is formed [11].…”
Section: Nb 3 Sn Formationmentioning
confidence: 99%
See 1 more Smart Citation
“…First fine grain Nb 3 Sn growth occurs in the presence of a Nb 6 Sn 5 layer. At 675 °C it needs typically 8 h to transform Nb 6 Sn 5 entirely into coarse grain (Nb-Ta) 3 Sn and subsequently only fine grain (Nb-Ta) 3 Sn is formed [11].…”
Section: Nb 3 Sn Formationmentioning
confidence: 99%
“…When measured with the spatial resolution of EDS in the Scanning Electron Microscope (SEM/EDS), the concentration gradient across the Nb 3 Sn layer of state-of-the-art high J c strands is in the order of 0.1 at.%Sn/μm. EDS measurements performed in the Transmission Electron Microscope (TEM/EDS) across individual Nb 3 Sn filaments in Internal Tin (IT) strands [3] show stronger local Sn concentration gradients than those revealed by EDS/SEM measurements. Here we report Sn concentration gradients on a nanometer scale in the A15 phase of a state-of-the-art PIT strand, as determined by TEM/EDS measurements using electron transparent lamellas prepared by the Focused Ion Beam (FIB) technique.…”
Section: Introductionmentioning
confidence: 98%
“…In order to increase the number of subelements above 217, we increased the size of the tube used for the restack from 19 mm (3/4 ) to 38.1 mm (1.5 ) [7]. In an effort to reduce further, we made a 396 subelement restack, denoted as T1692.…”
Section: Results On Strands With Low Arraysmentioning
confidence: 99%
“…Supergenics I LLC and Hyper Tech Research Inc. have explored several approaches including a tube approach [7]- [9]. In order to produce a strand that is stable over a wide field range, we have concentrated our research on lowering the effective filament diameter .…”
Section: Introductionmentioning
confidence: 99%
“…From figure 4 it can be seen that within experimental error the Sn concentrations in Tube type and RIT strands are more or less the same (note that for RIT strands the EDS spots were located at the centers of the original filaments which could result in a slight underestimation of the Sn content because of a Sn content gradient within this region [20]). The average Sn concentrations, which were calculated by averaging the Sn concentrations of different positions in the FG layer, of EG36-91Re-650x50 and T1489-615x480 are 22.7 at.% and 23.0 at.%, respectively.…”
Section: Stoichiometry and Grain Size Analysismentioning
confidence: 94%