2021
DOI: 10.1016/j.microrel.2021.114060
|View full text |Cite
|
Sign up to set email alerts
|

Computational evaluation of optimal reservoir and sink lengths for threshold current density of electromigration damage considering void and hillock formation

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2022
2022
2023
2023

Publication Types

Select...
3

Relationship

0
3

Authors

Journals

citations
Cited by 3 publications
(1 citation statement)
references
References 14 publications
0
1
0
Order By: Relevance
“…It is worth mentioning that in many previous publications, it has been stated that the electromigration phenomenon might intensify mass transfer caused by the direct application of an electric current to a sample. Current densities higher than 10 7 A/m 2 and high average atomic mobilities are desirable for accelerating mass transfer through electromigration [ 58 ]. In our previous work [ 29 ], we considered the electromigration rate to investigate the potential contribution of electromigration to mass transfer for a Ni–Al system under SPS conditions.…”
Section: Discussionmentioning
confidence: 99%
“…It is worth mentioning that in many previous publications, it has been stated that the electromigration phenomenon might intensify mass transfer caused by the direct application of an electric current to a sample. Current densities higher than 10 7 A/m 2 and high average atomic mobilities are desirable for accelerating mass transfer through electromigration [ 58 ]. In our previous work [ 29 ], we considered the electromigration rate to investigate the potential contribution of electromigration to mass transfer for a Ni–Al system under SPS conditions.…”
Section: Discussionmentioning
confidence: 99%