1974
DOI: 10.1002/pssa.2210230250
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Concentration dependence of the hall factor in n-type silicon

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Cited by 17 publications
(12 citation statements)
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“…1(b) at 300 K as a function of carrier concentration, which can be tuned in our calculations by changing the chemical potential. At low carrier density, our computed Hall factor is very close to the accepted value of ∼1.15 in n-type Si [7]. The computed Hall factor is within ∼10% of experiment at all carrier concentrations, a noteworthy result for a calculation without adjustable parameters.…”
Section: A Siliconsupporting
confidence: 83%
See 1 more Smart Citation
“…1(b) at 300 K as a function of carrier concentration, which can be tuned in our calculations by changing the chemical potential. At low carrier density, our computed Hall factor is very close to the accepted value of ∼1.15 in n-type Si [7]. The computed Hall factor is within ∼10% of experiment at all carrier concentrations, a noteworthy result for a calculation without adjustable parameters.…”
Section: A Siliconsupporting
confidence: 83%
“…Experimentally, magnetotransport has been studied extensively in metals [2] and simple semiconductors such as Si [7][8][9][10][11][12] and GaAs [13][14][15]. More recently, measurements on two-dimensional materials have shown unconventional behaviors, such as large nonsaturating MR at high fields in graphene [16][17][18] and WTe 2 [19], and various studies have shown an interplay between band-structure topology and magnetotransport, including the chiral anomaly and negative MR in topological semimetals [20][21][22].…”
Section: Introductionmentioning
confidence: 99%
“…The electron Hall factor versus donor density for 77 K and 300 K. Solid lines show the results of calculations. Symbols represent experimental data(Kirnas et al [1974]). Fig.…”
mentioning
confidence: 99%
“…Where r is the Hall scattering factor, which depends on the temperature and the carrier concentration, and q is the charge of the carrier, including the sign of the carrier concentration. The Hall scattering factor, for Si, takes values close to the unity for both holes 117 and electrons 118 . During this thesis, ≈ 1 for all calculations.…”
Section: Resistivity and Hall Effect: The Van Der Pauw Configurationmentioning
confidence: 97%